NOTE: You must use the correct holder for lift-out. NOTE: The Lift-Out procedure may be performed over two days instead of one as indicated in the procedure. NOTE: The Micro-sampling System Main Unit ...

In the single-beam FIB, such as our Hitachi FB-2000A FIB, some milling will occur during observation of the specimen. Surface features, such as thin films, can be milled away during this process. In ...

What is Focused Ion Beam Milling? Focused ion beam (FIB) milling is a nanofabrication technique that uses a focused beam of ions to precisely mill, etch, or deposit materials at the nanoscale. It ...

can be combined with the processing ability of a focused ion beam (FIB). During imaging, milling, or when performing 3D analytics, the Crossbeam accelerates the FIB applications. The new EDS module ...

TESCAN AMBER X pairs a Xe plasma FIB with BrightBeam™ SEM optics to provide high throughput, large area ion milling and fieldfree ultra-high-resolution imaging for 2D and 3D multi-modal ...