(Image: Wikipedia Commons, CC0 1.0) FIB milling relies on the interaction between a focused beam of ions and the sample surface. The most commonly used ion source is liquid metal ion source (LMIS), ...

This library contains most of the available experimental nuclear cross-sections relevant to ion beam analysis. Excitation functions are presented both as graphs and data files. Data collection is a ...

The 3D electron microscopy imaging is available using Serial Block Face (SB-EM) and Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) or Electron Tomography (ET) Electron tomography is TEM based ...