The JEOL JSM IT500 scanning electron microscope (SEM) is used for high-resolution imaging and qualitative X-ray microanalysis of conductive and non-conductive samples at a magnification range between ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The JSM-IT800 Ultrahigh Resolution Field ...

The JEOL JSM-IT100 is capable of 33-300,000X magnification with 4nm resolution. It is equipped with a secondary electron detector, backscatter electron detector, low vacuum secondary detector and ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The JSM-IT800 Ultrahigh Resolution Field ...

The JEOL TEM-F200 is a 200kV S/TEM equipped with a Cold Field Emission Gun for high brightness ... This tool excels in lightning fast data acquisition through simple and semi-automated operation. The ...

This new instrument will replace the aging JEOL JXA-8600 installed in 1988, and will offer superior quality analysis, both in term of precision and accuracy. This new 5-spectrometer instrument will ...