The JEOL 1400 High Contrast Transmission Electron Microscope is a state-of-the-art imaging system designed for high-resolution transmission electron microscopy (TEM). This microscope features advanced ...
The JEOL TEM-F200 is a 200kV S/TEM equipped with a Cold Field Emission Gun for high brightness and a narrow energy spread, supporting high energy resolution electron energy loss spectroscopy (EELS).
This technique can be used to scan a larger area of the sample or a specific point when using a scanning TEM (STEM). In 2019, researchers at precision-instrument manufacturer JEOL Ltd. and the ...
The “F2” is a simple-to-use, exceptionally stable, high-resolution imaging and analytical 200kV TEM that incorporates the latest JEOL advancements. The F2 is a multi-purpose workhorse system with ...
Multipurpose field emission transmission electron microscope with high spatial resolution and improved analytical performance. The JEOL JEM-F200 is a 200kV S/TEM equipped with a Cold Field Emission ...
The most recent additions are a Jeol 1400 TEM and Jeol IT300 SEM. A Gatan Cathodoluminescence detector has also been installed on our existing Field Emission Gun SEM. In 2015 a new high resolution ...
This new instrument will replace the aging JEOL JXA-8600 installed in 1988, and will offer superior quality analysis, both in term of precision and accuracy. This new 5-spectrometer instrument will ...
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