This new instrument will replace the aging JEOL JXA-8600 installed in 1988, and will offer superior quality analysis ... We expect to reach 1-10 ppm range for detection limit for most elements, which ...

The JEOL JSM IT500 scanning electron microscope (SEM) is used for high-resolution imaging and qualitative X-ray microanalysis of conductive and non-conductive samples at a magnification range between ...

5 mm HCN probe configuration with ECZ Luminous System. Image Credit: JEOL USA, Inc. HCP triple resonance experiment performed by 2 channel spectrometers (¹³C-³¹P {¹H} correlation). Image Credit: JEOL ...