The JEOL JSM IT500 scanning electron microscope (SEM) is used for high-resolution imaging and qualitative X-ray microanalysis of conductive and non-conductive samples at a magnification range between ...

This new instrument will replace the aging JEOL JXA-8600 installed in 1988, and will offer superior quality analysis ... We expect to reach 1-10 ppm range for detection limit for most elements, which ...

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Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Request A Quote Download PDF Copy Request A Quote Download ...