The JXA-8530F Plus also comes with JEOL's 30mm2 silicon-drift detector (SDD). A high count-rate SDD along with an in-situ variable aperture enables EDS analysis at WDS conditions allowing survey ...

This new instrument will replace the aging JEOL JXA-8600 installed in 1988, and will offer superior quality analysis, both in term of precision and accuracy. This new 5-spectrometer instrument will ...

The facility offers characterization of minerals, metals, and other solids through high-resolution imaging (SE, BSE, CL), microstructural analyses (EBSD), and non-destructive high-resolution chemical ...

The JEOL SEM combines optical and navigational imaging, EDS Live Analysis, and SEM imaging with just one click. The JSM-IT800 series has a sizable specimen chamber that can hold numerous detectors ...

The JEOL SEM smoothly incorporates navigation and optical imaging, EDS Live Analysis, and SEM imaging with just a one-click operation. The JSM-IT800 series is fitted with a huge specimen chamber that ...