Thin film measurement is a critical area of research in materials science and engineering, focusing on the characterization ... advancements in measurement techniques, particularly interferometry ...

The integration of XRR with complementary techniques, such as X-ray diffraction and X-ray fluorescence, will provide a more comprehensive understanding of thin film properties. Furthermore, the ...

The primary aim of this project is to synthesize various classes of light-absorbing materials tailored for photovoltaic applications, employing diverse material deposition techniques. Subsequently, ...

Germany’s Fraunhofer Center for Silicon Photovoltaics (Fraunhofer CSP) is developing a range of high-resolution material and thin film microscopic and nanoscopic characterization methods to use ...

The instrument can be configured with a wide range of wavelength options, allowing wide flexibility for different applications including CVD film characterization, thin-film solar cells, 2D materials, ...