资讯

EDN10 年
MicroSense ships Novel LED Sapphire Wafer Measurement Tools for Process Control
“LED manufacturers have found high sapphire wafer bow strongly correlates to LED yield loss. The UltraMap C200 utilizes our proprietary capacitive sensing technology and advanced high density wafer ...
AZOM4 年
Semi-Automated Metrology and Thickness Measurement of Semiconductor Wafers - PROFORMA SERIES
The tool offers highly precise, repeatable measurements of thickness, total thickness variation (TTV), wafer global flatness, wafer bow, etc. Built on MTI’s Push-Pull capacitance technology, the ...