The JEOL JSM IT500 scanning electron microscope (SEM) is used for high-resolution imaging and qualitative X-ray microanalysis of conductive and non-conductive samples at a magnification range between ...

This new instrument will replace the aging JEOL JXA-8600 installed in 1988, and will offer superior quality analysis, both in term of precision and accuracy. This new 5-spectrometer instrument will ...

The Microscope contains three independent condenser lenses, optimizing probe conditions for any given probe size for various applications like NBD or EDX. This enables enhanced diffraction and ...