This project is now read-only. It has been moved over to Codeberg. The development of this project continues at its new home.

Abstract: The limiting noise mechanism in field-effect transistors is thermal noise of the conducting channel. The noise can be represented by a current generator i2 in parallel to the output. The ...

A new technical paper titled “Thermally Dependent Metastability of Indium-Tungsten-Oxide Thin-Film Transistors” was published by researchers at Rochester Institute of Technology and Corning Research ...