Abstract As gate counts continue to swell at a rapid pace, modern systems-on-chip (SoCs) are increasingly integrating more design-for-testability (DfT) capabilities 1. Test and diagnosis of complex ...
Miteshwar M. Patel (ASIC Engineer, eInfochips Ltd) Nirav Nanavati (Tech Lead, eInfochips Ltd) Abstract Design for testability (DFT) and low power issues are very much related with each other. In this ...
This program receives images from the Turtlebot4 camera in a ROS2 environment, detects objects (fire extinguishers and people) in real time, estimates the locations of the objects, and publishes them ...