原子力显微镜 （英語： Atomic Force Microscope，简称 AFM），也称 扫描力显微镜 （英語： Scanning Force Microscope， SFM）是一种 纳米级 高分辨 的 扫描探针显微镜，优于 光学衍射极限 1000倍。 原子力显微镜的前身是 扫描隧道显微镜，是由 IBM 苏黎士 研究实验室的 卡尔文·奎特 （英语：Calvin_Quate） ， 格尔德·宾宁 和 格贝尔 在1986年在扫描隧道显微镜（STM， Scanning Tunnelling Microscope ）的基础上设计而来。 格爾德·賓寧 、魁特（Calvin Quate） …

AFM全称Atomic Force Microscope，即 原子力显微镜 ，它是继 扫描隧道显微镜 （Scanning Tunneling Microscope）之后发明的一种具有原子级高分辨的新型仪器，可以在大气和液体环境下对各种材料和样品进行纳米区域的物理性质包括形貌进行探测，或者直接进行纳米操纵。

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

纳米红外AFM-IR（Atomic force microscopy-based infrared spectroscopy）技术是一种基于原子力显微镜（Atomic Force Microscope，AFM）的红外光谱技术，它结合了AFM的高空间分辨率和红外光谱的化学分析能力，实现…

2025年1月27日 · Atomic force microscopy (AFM) is an imaging technique that can capture images at the nanoscale. It works like an electron microscope, but instead of imaging with light or electrons, it “feels” the surface it is trying to assess.

2023年6月5日 · The atomic force microscope (AFM) is a type of scanning probe microscope whose primary roles include measuring properties such as magnetism, height, friction. The resolution is measured in a nanometer, which is much more accurate and effective than the optical diffraction limit.

2017年4月6日 · Here, we review the basic principles, advantages and limitations of the most common AFM bioimaging modes, including the popular contact and dynamic modes, as well as recently developed modes such...

The atomic force microscope (AFM) was developed to overcome a basic drawback with STM – it can only image conducting or semiconducting surfaces. The AFM has the advantage of imaging almost any type of surface, including polymers, ceramics, …

2025年2月23日 · The AFM sensor is simultaneously excited at the flexural (f i) and torsional eigenmode (f TR) frequencies. The four-quadrant photodiode allows decoupling the flexural and torsional components of the sensor response. While the beam signal difference between the upper and lower quadrants relates to the flexural (vertical) movement of the sensor ...

The unique capabilities of the atomic force microscope (AFM), including super-resolution imaging, piconewton force-sensitivity, nanomanipulation and ability to work under physiological conditions, have offered exciting avenues for cellular and molecular biology research.