
Advanced Functional Materials - Wiley Online Library
2024年9月4日 · Advanced Functional Materials, part of the prestigious Advanced portfolio and a top-tier materials science journal, publishes outstanding research related to improving chemical and physical properties of materials.
一线大佬详解!关于AFM,读这篇文章就够了 - 知乎
2023年11月2日 · 相图是afm轻敲模式下的一种重要扩展技术,因表面抵挡及黏滞力的作用,会引起振动探针的相位改变量,而抵挡及黏滞力的差异由不同材料性质引起,因此相位差可以用于观察表面定性材质分布状况。
一文看懂原子力显微镜(AFM) - 知乎 - 知乎专栏
AFM全称Atomic Force Microscope,即 原子力显微镜 ,它是继 扫描隧道显微镜 (Scanning Tunneling Microscope)之后发明的一种具有原子级高分辨的新型仪器,可以在大气和液体环境下对各种材料和样品进行纳米区域的物理性质包括形貌进行探测,或者直接进行纳米操纵。
Localization atomic force microscopy - Nature
2021年6月16日 · Atomic force microscopy (AFM) 1 has the advantage of analysing unlabelled single molecules in physiological buffer and at ambient temperature and pressure,...
Recent advances in the application of atomic force microscopy to ...
2023年6月1日 · Combining single molecule force spectroscopy (SMFS) and imaging through the use of force-distance curve-based AFM (FD-AFM) has opened avenues for quantifying surface and structural properties of biological surfaces from reconstituted membranes to living cells, studying ligand-receptor dissociation dynamics, or localizing specific lipids, drug ...
Dimension Icon 原子力显微镜 - Bruker
基于核心成像模式(接触模式和轻敲模式),布鲁克提供的全套 afm测试模式,允许用户探测样品的电学、磁性等丰富性能。 布鲁克独创的全新的峰值力轻敲技术作为一种新的核心成像模式,已被应用到多种测量模式中,能同时提供形貌、电学和力学性能数据。
科研工具 | AFM图片处理——保姆级教程(一) - 知乎专栏
2024年12月26日 · Nanoscope Analysis是一款专门用于原子力显微镜(AFM)数据处理的软件,它提供了多种图像处理和分析功能,包括实用的游标分析、颜色表编辑、线性验证等。
Tap300Al-G AFM Probe - BudgetSensors
Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation. The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size.
Bimodal Atomic Force Microscopy with a Torsional Eigenmode for …
2025年2月23日 · In organic electronics, the nature and spatial distribution of grains in polycrystalline thin films of small organic semiconductor molecules greatly impact the electronic properties of devices. Therefore, tools that accurately characterize organic films at the mesoscopic level are essential. To this end, we demonstrate here the power of a bimodal atomic force microscopy (AFM) with a torsional ...
Atomic Force Microscopy of Biofilms—Imaging, Interactions, and ...
2016年7月13日 · Nunez et al. used AFM imaging and force measurement to study the action of Bdellovibrio bacteriovorus on E. coli biofilms. AFM characterized the change in E. coli cells, as they were attacked by the predatory bacterium with cells changing from rod‐shaped to a round shape, with a shrunken texture and the visible coil of B. bacteriovorus ...