
In the work reported on here, threshold Al KLL Auger spectroscopy was used to examine Al foil of technical purity (99.5%) before and after electrochemical treatment that altered the thickness …
Threshold Al KLL Auger spectra of oxidized aluminium foils
2003年11月4日 · Threshold Al KLL Auger electron spectroscopy and K-edge x-ray absorption fine structure spectroscopy have been used to examine technical purity (99.5%) aluminium foil …
In the present work, a pulsed electron-impact excitation for the 1s core hole creation in atomic Al has been used. The electron impact is well suited for KLL experiments as cas-cade transitions …
[1911.00428] Advanced chemical state studies of oxide films by lab ...
2019年11月1日 · Moreover, for industrially relevant elements like Al, Si and Ti, the combined access to the Al 1s, Si 1s or Ti 1s photoelectron line and its associated Al KLL, Si KLL or Ti …
使用俄歇电子能谱深度剖面对金属薄膜中锌和铝的氧化物状态进行 …
摘要 使用俄歇电子能谱 (AES) 对两种不同的商业薄金属层进行深度剖面分析,其中一层具有亚微米厚度,含有 Zn 和 Al 作为主要成分。 Al KLL 和 Zn LMM 峰的大的、依赖于氧化态的动能位 …
Characterisation of Al coordination at the outer surface of ...
1993年12月1日 · The chemical state of Al at the surface of dealuminated mordenites has been investigated by X-ray photoelectron spectroscopy. The Al 2p peaks can reasonably be …
Al KLL Auger spectra taken from various areas of the sample after ...
The Auger spectra from the nodules turn out to be very similar to those from the alloy matrix, and both appear to be composed mainly of oxidized Al (compare Al KLL spectra numbered (1) and …
Threshold Al KLL Auger spectra of oxidized aluminium …
Threshold Al KLL Auger electron spectroscopy and K-edge x-ray absorption fine structure spectroscopy have been used to examine technical purity (99.5%) aluminium foil before and …
Comparison of Al KLL Auger spectra taken at various
Results of resonant Auger spectroscopy experiments are presented for Cu, Co, and oxidized Al. Sub-lifetime narrowing of Auger spectra and generation of sub-lifetime narrowed absorption …
Al KLL Auger Profile Artifact at the Oxide-Metal Interface
J. S. Solomon, "Al KLL Auger Profile Artifact at the Oxide-Metal Interface," Appl. Spectrosc. 30, 46-49 (1976)
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