Argon electron configuration, X-ray photoelectron spectra, and other elemental information – part of the XPS Reference Table of Elements.

2018年4月1日 · Si/Nb/Si trilayers with 9.5 and 1.3 nm thick niobium layer prepared by magnetron sputtering were studied using XPS depth-profiling technique. Analysis of the Nb 3 d, Si 2 p HR …

2017年5月31日 · In this work, XPS depth profiles through a certified (European standard BCR-261T) 30 nm thick Ta 2 O 5 layer grown on Ta foil using monatomic Ar + and Ar 1000+ cluster …

Argon元素的电子配置，X射线光电子谱和其他元素信息，这些都是XPS元素参考表的一部分。 赛默飞科技提供高质量的Argon产品和服务，满足您的科研需求。

2024年6月30日 · The use of argon ion sputtering for depth profiling with XPS is desirable in corrosion science as oxide films and underlying metal compositions are often inhomogeneous …

• Argon clusters with ≥2000 atoms are good for profiling through organic layers with minimal chemical damage −These large clusters etch too slowly with

In this paper, we study the electronic states of Nb and Si at the surface and in depth of ultrathin Si/Nb/Si trilayers by means of depth-profiling X-ray Photoelectron Spectroscopy (XPS). …

X-ray photoelectron spectroscopy (XPS or ESCA) curve fitting procedures, reference materials and useful notes are listed here to provide a starting point for the consistent interpretation of …

We report the XPS study of argon sputtering on pure phase BFO film surface through the Bi 4 f and 5 d, O 1 s, Fe 2 p components, and its valence band. The effects of a low-pressure argon …

Argon develops a thick native oxide due to the reactive nature of clean Argon . The native oxide of Ar+O x is 6-7 nm thick. Argon thin films often have a low level of iron (Fe) in the bulk as a …