BeamMic® CMOS Entry Level 1440-1605 nmLaser Beam Profiler. 2048 x 1536 pixels with a with a 60 µm pitch; 24 fps at full resolution; BeamMic® software included

BeamMic 为需要对激光器光斑有基础直观了解而无需复杂分析的用户而设计。 • 测量数据和图像和保存为PDF 文档. • Ultracal 单点背景扣除技术，可将测量环境中的杂散背景光完全扣除掉，使 …

3.3.5 BeamMic™ - Basic Laser Beam Analyzer System • High-speed false color beam intensity profile displays in both 2D and 3D • Operates in Windows 7 and Windows 10 • Numerical beam profile analysis employs patented advanced calibration algorithms • Extensive set of ISO quantitative measurements • ISO beam width and diameter methods

2012年4月11日 · We are proud to announced BeamMic™, a new laser beam analyzer that combines the essentials for beam analysis in a low-cost, entry-level system. BeamMic includes easy-to-use software that measures a beam’s size, shape, uniformity, and mode content. Beam intensity profiles are displayed simultaneously in 2D and 3D.

Download the User Manual for Ophir's BeamMic, an entry-level laser beam analyzer designed for basic beam characterization. This user manual provides information on features, operation, and specifications.

Ultracal 单点背景扣除技术，可将测量环境中的杂散背景光完全扣除掉，使得测量结果真实，数据符合ISO 标准。 Ophir光束分析软件BeamMic 信息由先锋科技股份有限公司为您提供，如您想了解更多关于 Ophir光束分析软件BeamMic 报价、型号、参数等信息，欢迎来电或留言咨询。 成功提交信息，可获得积分。 详见 积分规则.

BeamMic includes a simplified set of measurements allowing for basic beam characterization to help improve your system performance without going to a full-featured SPC type system. This is perfect for the operator to do a quick check on the laser system prior to starting their process.

Ophir-Spiricon LLC has announced BeamMic, a laser beam analyzer that combines the essentials for beam analysis in an entry-level system. It includes software that measures a beam’s size, shape, uniformity and mode content.

diameter beams and low signal to noise conditions. Refer to the User Guide for additional information.

2012年4月3日 · BeamMic includes easy-to-use software that measures a beam's size, shape, uniformity, and mode content. Beam intensity profiles are displayed simultaneously in 2D and 3D. Statistical analyses can be performed on measurement functions and min/max limits can be set for pass/fail testing.