The quantum efficiency of a charge-coupled device (CCD) is a property of the photovoltaic response defined as the number of electron-hole pairs created and successfully read out by the device for each incoming photon.

For the STIS CCD, the default gain value of 1 offers the lowest read noise, but the analog-to-digital converter then limits the maximum signal that can be detected without saturation to about 33,000 e-per pixel. Using a CCDGAIN setting of 4 allows the full well of the CCD to be used.

2010年5月4日 · This effect (called “quantum yield”) of a single photon producing more than one electron must be taken into account properly when estimating the noise level for short-wavelength observations. Because the generation of multiple electrons is a random phenomenon, an extra noise term must be added to account for an observed variance larger than ...

This article explains the principal of quantum efficiency in high energy CCD detectors with respect to X-ray detection.

2019年7月1日 · By understanding the noise sources and quantifying them accurately, we can better estimate the photometric precision and the expected science yield for the mission. Very precise on-ground calibration and characterization of CCD detectors will significantly assist in the analysis of the science data obtained in space.

The quantum yield is the number of charge carriers generated per interacting photon (Janesick 2001). For CCD detectors in the optical, each detected photon usually gen-erates a single electron resulting in a quantum yield equal to 1. However, with higher energy UV photons, there is a non-zero probability of creating more than one electron

CCD Grading. Manufacturers of CCDs grade devices according to the number and type of defective pixels. The manufacturing yield of each sensor grade strongly affects the CCD cost; the more perfect the sensor, the higher its cost.

A simple equation for CCD yield depending on the technological environment condition is derived. An approach demonstrated can be generalized to analyze the yield relating problems for many kinds of ICs.

2020年1月1日 · The simplicity of CCD devices (fewer transistors and other structures compared to CMOS sensors) tends to produce higher yield at very large areas. It is certainly true that larger CMOS imagers can ultimately be produced since CMOS can be built on 300 + mm wafers, but yield is currently low and cost is very high.

2020年5月25日 · In order to determine the overall signal-to-noise ratio (SNR) of a CCD imaging system, we need to know the magnitude of the signal generated in response to incident light and the total noise. In the previous two articles, we explored …