2001年6月1日 · Real-time in situ ellipsometry was used to monitor and control the deposition process. The deposited coatings were characterized post-deposition using X-ray diffraction (XRD), Rutherford backscattering (RBS), X-ray photoelectron spectroscopy (XPS), and spectroscopic ellipsometry (SE).

2017年2月28日 · This study presents use of XPS to obtain several information of interest from tribofilms formed on CrN hard coatings: confirm their formation, estimate thickness, chemistry and compounds formed, as well as show influence of tribofilms’ …

2005年10月1日 · The XPS investigations of the surface of the Cr–N films show the presence of the elements Cr, N, O and contaminations of C and Si. Iron can be detected on the internal surface, the former interface between the metallic substrate and the …

者通过x 射线光电子能谱(xps)和x 射线衍射仪分析 了不同制膜工艺条件下在工具钢表面制备的Cr-N 涂 层的相组成及晶体取向特征，并采用扫描电镜(SEM)

通过XRD和DTG对膜进行表征，得出涂层的平均Cr2N和CrN的本体组成。 进行了高度灵敏的XPS研究，并根据反褶积峰强度定量估算了约10 nm厚度的薄膜表面范围的化学和相组成。 结果表明，氮化铬薄膜的表面组成与核不同，并且组成更复杂。 不仅检测到氮化铬（Cr2N和CrN），还检测到氮氧化铬和氧化铬（CrOx和CrOxHy）。 在较高氮气流量下制备的薄膜中也发现了金属铬。 Cr-N薄膜涂层是通过磁控溅射沉积在不同的氮气分压下制备的。 通过XRD和DTG对膜进行表 …

The (O+N)/Cr atomic ratio deduced from XPS in the films prepared with the Cr2O3 target increased with the increase of nitrogen flow, while the nitrogen concentration in samples prepared with the...

FESEM 显微照片证实了晶粒尺寸介于 50 和 250 nm 之间的光滑颗粒状表面。 XPS 研究表明涂层系统上存在 Cr 和 N。 光学研究表明，随着退火温度升高到 700 °C，CrN 涂层的太阳能吸收率从 61% 增加到 89%，在 800 °C 时略有下降，而光学带隙能量从 2.62 下降到1.38 eV，在 800 °C 时略微增加到 1.48 eV。 随着随后的退火进程，实现了 CrN 薄膜介电常数的逐渐增加。 纳米压痕结果表明，随着退火的进行， 更新日期：2018-06-01. 摘要 通过磁控溅射在 Si (100) 衬底上沉 …

The Cr 2p3/2 spectrum of chromium nitride (CrN) can be fit using the following peak shape parameters (for a 20 eV pass energy spectrum). Peak shape: LA (3.4,25,17) Peak width: 2.10 eV. Position: 574.6-574.8 eV. Note that other reports suggest a …

2018年8月2日 · The chemical composition of the CrN films was studied using x-ray photoelectron spectroscopy (XPS, Axis UltraDLD, Kratos Analytical, UK) equipped with a monochromatic Al x-ray radiation ( = 1486.6 ) source.

2018年9月18日 · Epitaxial CrN and epitaxial Cr 2 N were heated at 400 °C for 96 h, while the polycrystalline CrN test sample was only heated for 48 h. XPS results reveal that in the case of epitaxial films the elevated oxygen concentration persists down to the depth of 8 nm from the surface, after which the signal saturates at the level of 1.3 at % which is ...