3-Dimensional microstructural characterization of CdTe absorber …
2016年7月1日 · We characterized the growth of CdTe layers by EBSD in two and three dimensions. Recrystallization starts during deposition without chlorine treatment. …
Absorber texture and the efficiency of polycrystalline thin film CdTe ...
2024年3月30日 · We also provide an example of using EBSD to evaluate the texture of a CdSeTe/CdTe absorber from a high efficiency 18.7 % device with a MUD value of 2.03. This …
A correlative investigation of grain boundary crystallography and ...
2017年7月1日 · We correlate the crystallography of CdTe grain boundaries with their electronic properties. This is performed by combining cathodoluminescence and 3D-EBSD. Differences …
High Speed 3-Dimensional Characterisation of Graded CdSeTe/CdTe …
Abstract: 3D electron backscatter diffraction (3D EBSD) was carried out using a Xe-PFIB on CdTe thin film solar cells, with a graded CdSeTe (CST) layer. Devices with different ranges of CST …
Electron Backscatter Diffraction (EBSD) EBSD is an SEM-based characterization technique for measuring crystallographic orientation. An EBSD pattern from CdTe is shown in Figure 4. …
3-Dimensionnal Characterization of CdTe Solar Cells - mpie.de
CdTe solar cells in substrate and superstrate configuration produced at the Laboratory for Thin Films and Photovoltaics at the EMPA Duebendorf are investigated using conventionnal …
3D EBSD of CdTe/CdSeTe Thin Film Solar Cell Using Xenon-FIB Milling.
High-speed 3D EBSD has been used to measure microstructural changes of CdSeTe/ CdTe devices as a function of depth. The novel Xe-PFIB with high speed EBSD acquisition enables …
Microscopic Analysis of Interdiffusion and Void Formation in CdTe…
2020年8月8日 · In this study, we used transmission electron microscopy (TEM), energy-dispersive X-ray spectroscopy (EDS), and electron backscatter diffraction (EBSD) to investigate the …
3-Dimensional microstructural characterization of CdTe absorber …
Electron backscatter diffraction (EBSD) has been used to characterize the grain size, grain boundary structure, and texture of sputtered CdTe at varying deposition pressures before and …
(PDF) Electron backscatter diffraction and photoluminescence of ...
2011年6月1日 · Electron backscatter diffraction (EBSD) has been used to characterize the grain size, grain boundary structure, and texture of sputtered CdTe at varying...