Cadmium tungstate (CdWO4) nanoparticles were synthesized via a sonochemical method based on the reaction between cadmium (II) nitrate hexahydrate and sodium...

2011年9月1日 · In the present study, we have successfully prepared CdWO 4 nanocrystals by simple co-precipitation method without using any complexing agent and characterized their structural, morphological and electrical properties using XRD, FT-IR, TEM, HRTEM, EDAX and impedance spectra methods.

2022年2月19日 · XRD patterns of all samples confirmed the formation of the polycrystalline monophasic wolframite CdWO4. Parameters of the unit cells also were characterized by the Rietveld analysis. TEM images showed that the mean size of particles was 62 nm, 68 nm, and 53 nm for CWO, CWO: 0.5at%Ag +, and CWO: 0.5%Gd 3+, respectively.

We have prepared single crystalline Sn-doped Cd1−xSnxWO4 (where x = 0, 1, 3, and 5%) nanorods (NRDs) and characterized them using refined X-ray diffraction and TEM analysis, revealing a monoclinic...

1997年5月29日 · Mixed oxide powders belonging to the system CdMo x W 1-x O 4 have been prepared by a hydrothermal method. They have been characterized by the Rietveld analysis of their XRD patterns and by IR and Raman skeletal spectroscopies.

The present paper reports synthesis and photoluminescence studies of Cadmium tungstate (CdWO4) and Cerium doped CdWO4. The phosphor samples were synthesized by low cost and low temperature...

摘要 CdWO4/g-C3N4复合光催化剂首次采用简单的混合煅烧方法成功合成。 X 射线衍射 (XRD)、傅里叶变换红外光谱 (FTIR)、扫描电子显微镜 (SEM)、透射电子显微镜 (TEM)、高分辨透射电子显微镜 (HRTEM) 和漫反射光谱 (DRS) 进行分析所制备样品的晶体结构、形貌和光学性质。

扫描电子显微镜 (SEM)和透射电子显微镜 (TEM)表明，引入适量的Er可以优化CdWO 4的形貌。 X 射线衍射 (XRD) 结果表明较大的 Er 离子部分取代了 CdWO 4 中的 Cd 离子纳米晶体并在晶胞周围产生有利的晶格间隙和缺陷。

2019年10月1日 · 摘要 采用改进的水热法成功制备了花状纳米片组装体（FNA）钨酸镉（CdWO4）光催化剂。 使用 X 射线衍射 (XRD)、扫描电子显微镜 (SEM)、能量色散 X 射线光谱 (EDX)、X 射线光电子能谱 (XPS)、BET 表面积分析、傅立叶变换红外光谱对合成的纳米结构进行表征光谱 (FTIR) 和 ...

2024年6月5日 · XRD analysis was used to further characterize the prepared NC sample. Through this analysis, the crystal structure, phase, and size of the crystal made can be confirmed [70, 71]. XRD gives a fixed peak at specific 2θ value corresponding to the certain planes of the known phase of a material, which is the structural representation of a material ...