FE, or Field emission, refers to a phenomenon where high-density electrons are emitted when a strong electric field is applied to a cathode (electron emission element) with a sharpened tip. At room temperature, FE technology provides an electron beam that is approximately 1,000 times more dense (high intensity) than conventional thermionic ...

In electron microscopes, a field emission gun is used to produce an electron beam that is smaller in diameter, more coherent and with up to three orders of magnitude greater current density or brightness than can be achieved with conventional thermionic emitters such as tungsten or lanthanum hexaboride (LaB

2022年9月15日 · 一般来说，现在高分辨扫描电子显微镜配备的电子枪都是场发射电子枪（Field Emission Gun)。 图三所示的即为冷场发射电子枪（Cold FE Gun）的结构。 首先，阴极（即发射体）是由很细的钨丝，和在其尖上焊接曲率半径 100nm 左右的钨单晶构成。

OVERVIEW: A 300-kV cold FE-TEM, the HF-3300, has been developed by Hitachi High-Technologies Corporation. This TEM has next-generation analytical capabilities and a cold field emission electron source. Available for this TEM is a cold FE …

時に得られるCold FE電子銃（冷陰極電界放出形電子銃）を 搭載した電界放出形透過電子顕微鏡「HF-3300」を開発し た。Cold FE電子銃の有する特長が新たな解析評価技術を 生み，これまで電子顕微鏡では見ることができなかったものが 見られるようになってきた。

Since the first practical implementation of cold-field-emission technology in a commercial SEM in 1972, Hitachi has rigorously investigated and applied ultra-high-vacuum technology to house the field emitter and has thus managed to make cold field emission usable for ultra-high-resolution imaging in today's most advanced SEMs, such as the SU8200...

The new high-stability Cold FEG uses a thoroughly redesigned version of Hitachi's long-established cold field-emission electron source technology. Total system stability has also been optimized in order to achieve sub-Å imaging.

2020年7月2日 · JSM-6700F扫描电子显微镜（SEM）上安装了新开发的冷FE-GUN，使我们能够获得大的探针电流和低发射噪声，锥形强激发物镜。在 0.5 到 15kV 的加速电压范围内，与透镜内型 SEM 相比，该仪器具有更好的分辨率（Ohyama 等人 1986）（图 1）。

2023年1月1日 · The chapter will describe the development of a new emitter based on a carbon nano-cone after introducing the technology of the brightest sources now encountered in electron optics, namely cold field emission guns (CFEG).

2009年1月1日 · To incorporate a sophisticated FE electron gun into microscopes, it was necessary to create an ultrahigh vacuum (UHV) (of the order of 10 −8 Pa) to fundamentally stabilize the FE current. This chapter describes Hitachi's efforts over the past 40-plus years to develop CFE technology and STEMs.