2024年3月15日 · Variations in the coordination environment of Dy 3+ ions were elucidated through direct evidence from X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), Raman spectroscopy, and Fourier-transform infrared spectroscopy (FTIR) techniques and via indirect parameters, including Judd-Ofelt (J-O) parameters and the yellow-to-blue (Y/B ...

2015年4月1日 · For the Dy (OH) 3 nanorod before and after sputtering, high resolution Dy 3d 5/2 and 3d 3/2 XPS peaks were commonly observed at 1294.3 and 1332.2 eV, respectively, with a spin-orbit splitting of 37.9 eV [26].

Collect principal Dy (4d) peak as well as Dy (3d). Long time exposures (high dose) to X-rays can degrade various polymers, catalysts, high oxidation state compounds

The XPS spectrum of Dy2 3d is characterized by a double peak, namely, Dy 3d 3/2 and Dy 3d 5/2 at a BE of ca. 1297.0 and 1333.4 eV due to the spin−orbit splitting (Figure 4).

The XPS spectrum of Dy 3+ is presented in Figure 4 b, and the XPS peaks at 1304.33 eV and 1336.85 eV are attributed to the Dy 3d 5/2 and 3d 3/2 states, respectively.

Dysprosium (Dy) Compounds The XPS Spectra section provides raw and processed survey spectra, chemical state spectra, BE values, FWHM values, and overlays of key spectra.

2021年4月8日 · Transmission electron microscopy (TEM) confirms the particle size and size reduction observed through XRD. X-ray photoelectron spectroscopy (XPS) results suggest a change of the oxidation state from Sn 4+ to Sn 2+ with the Dy content, with more Dy 3+ than the values accessed from EDS analysis.

2009年7月23日 · The present investigation is devoted to the X-ray photoelectron spectroscopy (XPS) analysis of the main core levels (C 1 s, O 1 s, Dy 4 d, Dy 3 d) of a representative dysprosium (III) oxide thin film.

2007年12月1日 · The present investigation is devoted to the X-ray photoelectron spectroscopy (XPS) analysis of the main core levels (C 1s, O 1s, Dy 4d, Dy 3d) of a representative dysprosium (III) oxide...

本研究致力于代表性氧化oxide（III）薄膜的主要核心能级（C 1s，O 1s，Dy 4d，Dy 3d）的X射线光电子能谱（XPS）分析。 通过在N2 / O2气氛中从Dy（（iPrN）2CNMe2）3开始的金属有机化学气相沉积（MOCVD），在500℃的Si（100）上生长样品。