
SEMI E-142 Wafer Map format - Artwork
2016年11月30日 · The SEMI E142 Wafer Map XML File. November 30, 2016 Steve DiBartolomeo ... If not specified, E142 indicates that LowerLeft is the default and Axis direction default = UpRight. Reference Devices. There should always be at least one reference die referenced in the map data. We need to know two things for the reference information to be useful:
E14200 - SEMI E142 - Specification for Substrate Mapping
Subordinate Standards (included)SEMI E142.1 — Specification for XML Schema for Substrate MappingSEMI E142.2 — Specification for SECS II Protocol for Substrate MappingSEMI E142.3 — Specification for Web Services for Substrate MappingSEMI E142.4 — Specification for SECS II Protocol for Substrate
WaferMap Convert Glossary of Terms - Artwork
E142 allows multiple maps to be "overlaid" on a single substrate. For example, if more than one test were performed, the results of each test could be recorded in separate maps. ... axis direction - the direction in which the array indexes increase for X and for Y. Typically for an origin in the LowerLeft the Axis would be UpRight. However ...
SEMI E142 Specification for Substrate Mapping | eInnoSys
The SEMI E142 specification outlines the data requirements for reporting, storing, and transmitting map data for substrates such as wafers, frames, strips, and trays. This specification plays a pivotal role in assembly, packaging, and testing, supporting high-precision processes throughout the lifecycle of semiconductor devices.
SEMI E142: Substrate Mapping - PEER Group
SEMI E142: Substrate Mapping Describes how the factory host and equipment can exchange substrate map data through a standard SECS/GEM interface, using typical GEM event reports and SEMI E39 object requests (Stream 14 messages). Each substrate map provides details about individual locations (units, cells, dies, etc.) on a substrate (wafer, tray ...
半导体应用系统一些小知识收集(strip&wafer mapping,EAP&scada) …
2023年11月12日 · Substrate mapping的挑战在于多芯片管理。当单一组件可以从不同的wafer中消耗多个die时,要满足System in Package (SiP)和多芯片组件(见图3)的需求不是很容易。Substrate管理基于Semi E142标准,以提供一个完全的追踪能力。 多芯片和堆叠芯片的管理
SECS/GEM解决方案:C、C++、Labview、C# - 知乎 - 知乎专栏
扩展支持SEMI E39、E40、E87、E90、E94、E116、E142. 支持多开发语言 C、 C++ 、C#、 Labview 、QT。. 可选 PLC 与 MES 的软件桥接模块,无需开发。. 采用DLL模块方式,自由添加到设备软件中。. 提供主机EAP模拟软件,轻松自动化控制设备。. 支持x86、x64 版本. 1.1 产品概述
半导体设备通讯标准介绍(二) SECS/GEM开发 - 百家号
2022年4月29日 · 扩展支持semi e39、e40、e87、e90、e94、e116、e142 支持多开发语言 C、C++、C#、Labview、QT。 可选PLC与MES的软件桥接模块,无需开发。
The SEMI E142 Wafer Map XML File - Artwork
2016年11月30日 · If not specified, E142 indicates that LowerLeft is the default and Axis direction default = UpRight. Reference Devices. There should always be at least one reference die referenced in the map data. We need to know two things for the reference information to be useful: where in the array is the reference die located?
SEMI-E142 | Specification for Substrate Mapping - Document …
Document Number. SEMI-E142. Revision Level. 2011 EDITION. Status. Current. Publication Date. Feb. 1, 2011
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