
Damage analysis of CMOS electro-optical imaging system by a …
EOIS (electro-optical imaging system) is vulnerable to laser beam because EOIS focuses the incident laser beam onto the image sensor via lens module. Accordingly, the laser-induced damage of EOIS is necessary to be identified for the counter-measure against the laser attack.
What Is EO?/IR? - Teledyne FLIR
2019年7月26日 · EO/IR (Electro-Optical/Infra-Red) systems are imaging systems used for military or law enforcement applications which include both visible and infrared sensors. Because they span both visible and infrared wavelengths, EO/IR systems provide total situational awareness both day and night and in low light conditions.
Damage analysis of CMOS electro-optical imaging ... - Semantic …
2016年8月10日 · In this study, the damage of CMOS EOIS and image sensor induced by CW (continuous wave) NIR (near infrared) laser was experimentally investigated. When the laser was emitted to CMOS EOIS, a temporary damage was occurred…
Damage analysis of CMOS electro-optical imaging system
2016年8月10日 · EOIS (electro-optical imaging system) is vulnerable to laser beam because EOIS focuses the incident laser beam onto the image sensor via lens module. Accordingly, the laser-induced damage...
Damage Analysis of CCD Image Sensor Irradiated by Continuous Wave Laser
2016年12月5日 · EOIS (electro-optical imaging system) is the main target of the laser weapon. Specially, the image sensor will be vulnerable because EOIS focuses the incident...
波激光对CMOS EOIS(electro-optical imaging system)和图像传感器进行了激光毁伤实验研 究。发现塑料制成的透镜和透镜模组熔化会导致 图像模糊、黑屏等永久性损伤现象[1]。2017年, Schwarz B等人利用脉冲激光和连续激光对 CMOS和CCD相机进行了激光损伤对比研究。
Damage analysis of CMOS electro-optical imaging system by a
In this study, the damage of CMOS EOIS and image sensor induced by CW (continuous wave) NIR (near infrared) laser was experimentally investigated. When the laser was emitted to CMOS EOIS, a temporary damage was occurred first such as flickering or dazzling and then a permanent damage was followed as the increase of laser irradiance and ...
Damage analysis of CMOS electro-optical imaging system ... - 百度 …
In this study, the damage of CMOS EOIS and image sensor induced by CW (continuous wave) NIR (near infrared) laser was experimentally investigated. When the laser was emitted to CMOS EOIS, a temporary damage was occurred first such as flickering or dazzling and then a permanent damage was followed as the increase of laser irradiance and ...
ScholarWorks@Hanyang University: Damage analysis of CMOS …
CMOS; CW (continuous wave) NIR (near-infrared) laser; EOIS (electro-optical imaging system); LIDTs (laser-induced damage thresholds) Citation Proceedings of SPIE - The International Society for Optical Engineering, v.9983, pp.1 - 5 Indexed SCOPUS Journal Title Proceedings of SPIE - The International Society for Optical Engineering Volume 9983 ...
EO/IR systems cover a wide range of distinct technologies based on the targets and mission to be accomplished. Target phenomenology often dominates the choice of spectral band. For example, missile launch detection depends on the very hot missile exhaust, which produces significant radiation in the ultraviolet (UV) spectral region.