Since the introduction of electron microscopes in the 1930s, scanning electron microscopy (SEM) has developed into a critical tool within many research fields, spanning everything from …

Focused ion beam scanning electron microscopy (FIB SEM) instruments for automated structural analysis, TEM sample preparation, and nanoprototyping.

Instrument name: FEI Quanta 450 Scanning Electron Microscope (SEM) Description: The SEM is used to examine surface features and to collect compositional information of objects and …

The FEI Helios NanoLab 660 DualBeam system integrates advanced scanning electron microscope (SEM) and focused ion beam (FIB) technologies with plasma cleaner, Gas …

The FEI Helios NanoLab 400 DualBeam system is a fully digital Field Emission Scanning Electron Microscope (FE SEM) equipped with Focused Ion Beam (FIB) technology.

In a scanning electron microscope (SEM) a focused electron beam is scanned over the sample. The electrons interact with the material which produces secondary quantities or backscatters …

The FEI Sirion Scanning Electron Microscope (SEM) is a high-resolution instrument with an electron beam voltage range from 200V – 30kV. The field-emission electron source (FEG) and …

The FEI Teneo LV SEM instrument is a Field Emission Scanning Electron Microscope (FESEM) t hat combines high and low-voltage ultra-high resolution capabilities with the world’s only low …

The FEI Helios 660 Focus Ion Beam Scanning Electron Microscope (FIB-SEM) is a workhorse for both radiological and non-radiological material sample preparation and analysis in energy, …

This DualBeam SEM/FIB is designed for demanding nanoscale work, resolving the finest details (extremely high resolution) in 2D and 3D with clearest contrast, nanoprototyping, and highest …