The XL-30 ESEM combines a high-brightness FEG source with a conventional electron column. Unlike conventional SEMs which require high vacuum in the specimen chamber, the microscope can be run in a “high-pressure” environmental mode allowing the examination of hydrated or insulating samples.

The XL30 S FEG is a top performing Schottky emitter based immersion microscope that suites the needs of users in material science, life-science, semi-conductor FA and process development labs. The system is optimized for operation at low kV, allowing un-coated and isolating materials to be examined with minimum charging. Operation of the system ...

The XL-30 Environmental Scanning Electron Microscope (ESEM) is a state of the art high resolution research instrument. It has a field emission electron gun (FEG) and can be operated in three vacuum modes, e.g., conventional high vacuum, low vacuum and true environmental mode.

The FEI XL30 includes a Tungsten emitter, 5 axis stage, 50x50mm XY, turbo vacuum, plus installation, 90-day warranty and basic operational training.

High resolution scanning electron microscope completely controlled under WindowNT. Equipped with a high stability Schottky field emission gun and a large specimen chamber (379x280 mm door size). Back scattering detector for Z-imaging. Voltage: 500-30keV; Resolution: 1.2 nm @30keV. Copyright © 2025 The Regents of the University of California.

The XL-30 SFEG is a top performing Schottky emitter based immersion microscope that suites the needs of users in material science, life-science, semi-conductor FA and process development labs. The system is optimized for operation at low kV, allowing un-coated and isolating materials to be examined with minimum charging.

XL-30 ESEM is an FE SEM that can be run in a “high-pressure” environmental mode allowing examination of hydrated or insulating samples.

The XL30-SFEG is a high-resolution scanning electron microscope capable of resolutions better than 2 nm, magnifications over 600 kX, and operating voltages from 200 volts up to 30 kV with 1 kV and 2

DIFFICULT: The XL-30 Sirion machine has the ability to perform high-resolution low voltage ( 1kV) imaging.

(TSS#1237) This XL30 FEG includes: • Electron column with Schottky field emitter, 1 to 30kV • Everhart-Thornley secondary detector • Windows OS and FEI UI; TSS networking computer to make IT happy • Five-axis comp-eucentric stage • Motorized XYZ: 50 x 50 x 20 mm • Manual T: – 10° to + 60°, Motorized R: n x 360°