
Gate-Cut-Last in RMG to Enable Gate Extension Scaling and …
This novel gate cut (CT) technique allows the scaling of gate extension length past the end fin which reduces parasitic capacitance, leakage and performance variation. In addition, we …
The study of 28nm node poly double patterning integrated process
As the development of semiconductor devices, especially for 28 nm technology node and beyond, the shorten effect in line ends of poly gate will be challenging as the size grow smaller, …
先进逻辑工艺流程:FinFET-22nm Gate last Process flow - 知乎
在一个晶体管内,gate contact(栅接触点)是源极(source)到漏极(drain)电流的控制点;gate contact 就连接上层的 via 导孔了。 一般来说,gate contact 会伸到单元之外的地方(虽 …
14nm metal gate film stack development and challenges
In this work, atomic layer deposition (ALD) metal films, including TaN, TiN (TiSiN), TiAl and CVD W, were studied for replacement metal gate application. Challenges of step coverage & gap …
(PDF) Sub-20nm Logic Lithography Optimization with Simple OPC …
2012年2月1日 · In this study, we extend the scaling using simplified OPC beyond 20nm in small steps, eventually reaching the 16nm node. The same "cut" pattern is used for each set of …
The Metal Gate Cut Process Development - IOPscience
2020年11月23日 · The gate cut last has been widely adopted since it can provide better SiP/SiGe growth environment, hence yielding the better electrical performance. However, this approach …
先进工艺中的Cut Metal与 Metal Extension技术 - 春风一郎 - 博客园
2020年3月28日 · ICC2 支持cut metal技术从P&R到signoff的实现。 通常Layer 1 的cut metal只能插在固定的位置( preferred grid ),Layer 2cut metal无固定位置(请具体参照对应工艺)。 下图 …
The Metal Gate Cut Process Development-期刊-万方数据知识服务 …
2020年11月18日 · The metal gate cut (MGC) will be widely adopted since it can provide better SiP/SiGe growth environment, improve yield and enhance electrical performance. However, …
The Gate Cut Process Window Discussion - 科研通
Continuous process window modeling for process variation aware OPC and lithography verification; The calibration of process window model for 55-nm node; Cutting Force Changes …
11nm Logic Lithography with OPC-Lite - ResearchGate
2014年2月24日 · Experimental demonstration of these cut layers using design optimization, OPC-Lite, and conventional illuminators at the 7nm node dimensions will be presented. Lines were …