High Voltage Stress Test (HVST) is critical for screening out latent defects to ensure quality on automotive semiconductor devices. This paper describes a novel

2001年4月29日 · This paper presents the first-ever research on high-voltage stress of analog circuits to enhance their oxide reliability and to reduce the manufacturing cost. The emphasis of this paper is placed on how to properly stress analog circuits and the development of efficient algorithms for generating stress vectors that meet the stress coverage ...

2017年3月1日 · This review article provides a comprehensive overview of the many factors that may enhance the level of electric field along the high voltage (HV) insulators, review of existing stress control methods and new promising technologies in …

加壓測試(Stress Test)是一種加速篩選具有早期缺陷的元件以維持可靠度的一種技術。 其目的在於迫使具有早期缺陷的元件提早從故障率高的區域進入穩定期。

Reliability modeling is important for determining the working lifetime of HV isolation products that experience continuous HV stress (e.g., 400 to 1500Vpeak) with high frequencies (e.g., 10 kHz to 100 kHz) and high dV/dt (e.g., up to 300 V/nanosecond). Several standards exist to establish the isolation level of an electronic device [1].

2006年4月1日 · High-voltage stress testing (HVST) is common in IC manufacturing, but publications comparing it with other test and burn-in methods are scarce. This article shows that the...

IDDQ testing has been introduced to CMOS production lines for achieving higher quality and reliability. In addition, electrical stress applying method called High Voltage Stress (HVS) method was proposed for reliable rejection of weak insulation (such …

The most critical aspect of high voltage cable jointing and termination is control of the dielectric stress originated at the point of screen termination–electric stress control.

The quality of HV isolation is demonstrated by substantial margins using statistical test methods. The reliability of the HV isolation process technology is proven to have high isolation margin by TDDB, which is the industry standard method of proving lifetime at use conditions.

2006年3月1日 · Editor's note: High-voltage stress testing (HVST) is common in IC manufacturing, but publications comparing it with other test and burn-in methods are scarce. This article shows that the use of HVST can dramatically reduce the amount of required burn-in.--Phil Nigh, IBM Microelectronics