2013年5月13日 · Scope: This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to: Testing the interconnections between integrated circuits once they have been assembled onto a printed circuit board or other substrate - Testing the integrated circuit itself - Observing or modifying circuit activity durin...

In the 1980s, the Joint Test Action Group (JTAG) developed a specification for boundary-scan testing that was later standardized as the IEEE Std. 1149.1 specification. This boundary-scan test (BST) architecture offers the capability to efficiently …

2008年9月26日 · Circuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit boards and the test of internal circuits is defined. The circuitry includes a standard interface through which instructions and …

The IEEE 1149.1 standard has stood the test of time. Since 1990 it has served as the embedded test technology in thousands of ICs, providing the test and programming backbone to countless board and system designs.

The JTAG/IEEE 1149.1 test standard is becoming widely accepted as a way to overcome the problems created by surface-mount packages, double-sided boards, and multichip modules (see Figure 1), all of which result in a loss of physical access to signals on the board.

IEEE 1149.1 JTAG and Boundary-Scan Tutorial 1 Table of Contents Introduction 5 Chapter 1: The Motivation for Boundary-Scan Architecture 6 Chapter 2: The Principle of Boundary-Scan Architecture 7 Using the Scan Path 7 Chapter 3: IEEE 1149.1 Device Architecture 11 The Instruction Register 11 The Instructions 12

Design for test (DFT), also known as design for testability, is a process that incorporates rules and techniques in the design of a product to make testing easier. Structured design for test is a …

2009年11月10日 · The IEEE 1149.1 standard defines test logic that can be included in an integrated circuit to provide standardized approaches to - testing the interconnections between integrated circuits once they have been assembled onto a printed circuit board or other substrate;

Abstract: Circuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit boards and the test of internal circuits is defined. The circuitry includes a standard interface through which instructions and test data are communicated.

2022年12月18日 · IEEE 1149.1, also known as “JTAG” for the Joint Test Action Group that created it, is the specification that became the foundation of many other in-chip related technologies, such as: 1149.6 – IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks. 1532 – IEEE Standard for In-System Configuration of Programmable Devices