
How SEM Analysis can be used to Characterize a Solder Joint - indium…
2020年3月23日 · Scanning Electron Microscopy (SEM) is a technique used to characterize cross sections of solder joints to identify a root cause to a soldering failure. Although there are many different detection methods that can be used with a SEM, the two most common detection methods are Backscattered Electron (BSE) detection and Secondary Electron (SEI ...
SEM分析法你了解过吗?铟泰公司应对焊接缺陷有高招!
SEM是一种利用细聚焦的电子束轰击样品表面,通过电子与样品相互作用产生的二次电子、背散射电子等对样品表面或断口形貌进行观察和分析的设备。 SEM的焦深比透射电子显微镜大10倍,比光学显微镜大数百倍,因此扫描得出的电子像富有立体感,具有三维形态,相较于其他显微镜能够提供更多的信息。 因此,SEM在失效分析中具有重要的应用价值,尤其在确定失效模式和查找失效成因方面发挥着举足轻重的作用。 在失效分析中,SEM的应用主要体现在以下几个方面:1. …
Measuring Non-Destructively the Total Indium Content and Its
2022年6月28日 · Here, a facile method based on energy-dispersive X-ray spectroscopy (EDXS) in a scanning electron microscope (SEM) is presented that allows the indium content of a single semiconductor layer deposited on a gallium arsenide substrate to be measured with relatively high accuracy (±0.7 monolayers).
Although the SEM of indium solders is not very informative compositionally, the indium-copper or indium-tin-copper intermetallic 9 can be easily seen (Figs. 6-9 and 6-10)_
Thermally grown indium (In) thin-film for creating ohmic contact …
2022年9月15日 · Indium (In) thin films over the mercury cadmium telluride (HgCdTe) substrate were grown employing the thermal evaporation method. Various techniques, namely X-ray diffraction, scanning electron microscopy (SEM), energy dispersive X-ray, atomic force microscopy, and current-voltage (I-V) were employed to investigate the developed films.
The SEM pictures of indium thin films (a) SEM pictures of indium thin ...
The SEM image for sputtering of (In) on annealed AZ91 alloy surface indicates the indium thin film with some nucleation sites for growth that have completely obvious and inevitable of ...
SEM images of mesoporous indium tin oxide (ITO) films
Well-ordered 3D mesoporous indium tin oxide (ITO) films obtained by a templated sol-gel route are discussed as conductive porous current collectors. This paper explores the use of such films...
SEM | Indium Corporation Blogs
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铟 | XPS元素周期表 | 赛默飞 | Thermo Fisher Scientific - CN
Most elements were discovered while scientists searched for other materials, and indium is no exception. This very soft, silvery-white metal has a bright luster and emits a high-pitched “cry” when bent. One of the first major applications for indium was as a coating for bearings on high-performance aircraft during World War II.
Intermetallics | Indium Corporation Blogs
Backscattered Electrons and Secondary Electrons are used as two different detection methods in a Scanning Electron Microscope (SEM). Each detecion met...