XPS measurements (figure 1) show that the surface composition of the ITO film is: O-55.1 at%, In – 40.6 at% and Sn – 4.3 at.%, which means that the film is indium rich.

2022年2月10日 · The surface chemical composition and the oxygen vacancies of ITO films annealed in different atmospheres were investigated by XPS. Fig. 7 (a–d) shows the XPS spectra of the survey, In 3d, Sn 3d and O 1s core levels, respectively.

2005年1月1日 · SEM and energy dispersive X-ray spectrometry (EDX) provides 3-D images and bulk chemical composition (Sn/In ratio) of the ITO powders. By use of TEM, primary particle sizes were measured, and the particle size distribution was determined.

The Indium Tin Oxide (ITO) platform is one of the promising solutions for state-of-the-art integrated optical modulators towards low-loss silicon photonics applications.

2016年11月18日 · The XPS, X-ray diffraction and electrochemical investigations demonstrate clearly the intercalation of the electrolyte cation into the ITO materials and the electrochemical reversibility of the...

Download scientific diagram | XPS spectra of pristine ITO-coated glass substrates (provided by Kintec): (a) O 1s spectrum, (b) In 3d 5/2 spectrum, (c) Sn 3d 5/2 spectrum, and (d) valence-band...

2005年9月15日 · 分别用XPS和AES分析了ITO薄膜真空退火前后各元素化学状态的变化和深度分布情况研究表明,退火前后Sn和In处于各自相同的化学状态中.O以氧充足和氧缺乏两种化合状态存在,其结合能值分别为 (529.90±0.30)eV和 (531.40±0.20)eV.氧缺位状态主要分布在薄膜表层.各元素在 ...

分别用 XPS和 AES分析了ITO薄膜真空退火前后各元素化学状态的变化和深度分布情况.研究表明,退火前后Sn和In处于各自相同的化学状态中.O以氧充足和氧缺乏两种化合状态存在,其结合能值分别为 (529.90±0.30)eV和 (531.40±0.20)eV.氧缺位状态主要分布在薄膜表层各元素在 ...

做了一个SnO2:Mn薄膜的XPS数据，O和Mn的峰都没啥问题，但是感觉Sn的峰很奇怪，其中两个最主要的峰应该是Sn3d1/2和Sn3d3/2的峰，但是这两个旁边怎么还有个小峰呢。

2020年3月18日 · Here, we demonstrate low sheet resistance (<400 Ω −1 at room temperature) and high IR transmittance (>65% at the 2.5-μm wavelength) in Sn-doped In2O3 (ITO) epitaxial films for the thickness ...