JEOL SDD detectors deliver unparalleled EDX analytical results for a wide range of materials, offering solid angles as high or greater than 2.2sr depending upon the TEM/STEM configuration. Utilizing JEOL’s unique, on-the-fly “Lossless Drift Compensation”, large pixel EDX maps can be generated at up to atomic resolution, even for beam ...

Gather-X, a new Windowless EDS from JEOL, answers the need for higher sensitivity and low-energy X-Ray detection. The new 100mm 2 windowless EDS can collect the entire X-ray range produced from the IT800 series FE SEMs including low-energy X-rays down to Lithium.

The JED-2300 Analysis Station Plus, an EDS system to perform elemental analysis by detecting characteristic X-rays generated from a specimen, was developed based on the design concept of “Seamless from Observation to Analysis” using many years of experience of JEOL in electron optics and EDS.

The newly developed DrySD™ Gather-X is a Windowless type EDS that is installable to JSM-IT800*. High sensitivity X-ray analysis is possible in all energy bands including low energy characteristic X-rays such as Li-K (54eV).

Our analytical model SEMs include a fully-embedded JEOL EDS microanalysis system with advanced functionality. From our benchtop SEM to our highest-resolution FE SEM, we offer an EDS spectrometer designed by JEOL exclusively for …

エネルギー分散形X線分析装置（Energy Dispersive X-ray Spectrometer：EDS）は電子顕微鏡にアタッチメントとして装着し、電子線照射により試料から発生した特性X線を検出して元素分析を行う装置です。 JED-2300 Analysis Station Plus は、JEOL製の電子顕微鏡用に設計されたドライSD™（Dry Silicon Drift Detector）、高速アナライザー、分析ソフトを持つEDS分析システムです。 JED-2300 Analysis Station Plus は「観察から分析までシームレスに」をコンセプトに …

JEOL supplies a range of powerful x-ray microanalysis solutions in the fields of energy dispersive (EDX), wavelength dispersive (WDX) and light element (SXES) analytics. Not only is SXES analysis capable of precisely detecting very light elements and trace element analysis, it can also examine bonding states (chemical shift).

新開発のドライSD™ Gather-XはJSM-IT800に搭載可能 (※) なWindowlessタイプのEDSです。 Li-K (54 eV) に代表される低エネルギー特性X線を含んだ全エネルギー帯域での高感度X線分析が可能、さらに、JSM-IT800と連動した安全機能とSEM/EDS統合ソフトウェアにより、使う方を選ばない安心・快適な操作性を提供します。 Windowless化により､1 keV以下のエネルギーの特性X線検出感度が大幅に向上したほか、Li-Kなど100 eV以下の軟X線領域も検出可能です。 リ …

Elemental mapping data acquired by JEOL’s EDS conserves spectrum at every pixel for each frame, together with electron beam images. The “play back” function enables multilateral analyses including an observation of the change of spectrum over a period of time.

Jeol IT200 SEM-EDX system At the Experimental Techniques Centre, we have a number of electron microscopes to cater for a wide variety of materials, samples and products. The workhorse of our electron microscopy suite, this instrument caters to the everyday needs of high magnification imaging and elemental analysis.