"NEOARM" supports enhanced contrast of light elements by a newly-designed ABF imaging technique (e-ABF：enhanced ABF). This capability facilitates atomic-level structure observation of materials containing light elements.

The NEOARM excels at atomic-resolution imaging for a wide range of accelerating voltages ranging from 30 kV to 200 kV. The NEOARM features a unique cold field emission gun (Cold-FEG) as well as a next generation advanced Cs corrector (ASCOR) that compensates for higher order aberrations.

We have recently (early 2021) installed a state-of-the-art JEOL NEOARM 200 kV aberration corrected STEM/TEM instrument ($2.5M) funded by NSF and the University of New Mexico in the Nanomaterials Characterization Facility in the PAIS building.

JEOL JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope "NEOARM" / JEM-ARM200F comes with JEOL’s unique cold field emission gun (Cold FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations.

JEOL COSMO™は、新しい収差アルゴリズム (SRAM： Segmented Ronchigram Auto-correction function Matrix) を採用したことにより、収差補正のための標準試料に入れ替えなくとも、高次の収差まで高精度かつ迅速に補正することが可能です。 一般的な補正アルゴリズムと比較し高速な処理が可能であり、操作も自動化されていますので、お客様のワークフローを複雑にするこ …

JEOL COSMOTM, the aberration correction software, enables quick high resolution observation by a “NEO algorithm”. Now, no special sample is required for corrector tuning.

The NEOARM is a probe aberration corrected S/TEM with a Cold Field Emission Gun (cFEG), the first-of-its-kind in Virginia Tech, with the following features: •Source: Cold Field Emission gun •Aberration corrector alignment: High-precision correction of …

The JEOL NEOARM is a probe-corrected transmission electron microscope with aberration correction from 30 kV to 200 kV. Graphene mono layer at 30 kV. Image courtesy of JEOL. Key Features. Atomic-level imaging at 30 kV, 80 kV and 200 kV in STEM; Atomic-level elemental mapping (EDXS and EELS) Electric binding state and plasmon mapping (EELS)

2020年12月10日 · Auto Tuning for HR-STEM for crystalline sample. Micro electron diffraction, or microED, is a technique aimed at solving structures of biological macromolecules by electron diffraction. Barn-storming work by the group from Prof. Gonen showed the impressive impact and promise of this technique1.

Das neue JEOL NEOARM / JEM-ARM200F zeichnet sich durch eine kalte Feldemissionsquelle (Cold FEG) und einen neuen Cs-Korrektor (ASCOR), der Aberrationen höherer Ordnungen kompensiert, aus.