The KLA 2135 is a wafer inspection system based on a high-speed digital imaging technique, which is widely used for in-line monitoring. Figure 18.3 shows different types of defects detectable with the KLA 2135. Not only particles and scratches, but also pattern shorts, missing contact holes and film residues are detectable.

KLA/TENCOR 2135是一种先进的掩模和晶片检测系统，能够检测具有高质量、高通量图像的亚纳米缺陷，并具有先进的缺陷检测和表征算法，提供了卓越的图像质量和工艺优化。

KLA/TENCOR 2135是一款前沿掩模和晶片检测设备，为先进的半导体制造工艺提供高速、高精度的分析，具有自动缺陷检测、晶片表面映射、缺陷分类等特点。

KLA/TENCOR 2135是一種先進的掩模和晶片檢測系統，能夠檢測具有高質量、高通量圖像的亞納米缺陷，並具有先進的缺陷檢測和表征算法，提供了卓越的圖像質量和工藝優化。

KLA/TENCOR 2135是一種掩模和晶片檢測設備，能夠檢測半導體晶片和掩模中的缺陷。 它具有高分辨率激光基底成像系統，能夠快速準確地檢測缺陷。

Equipment description: ‧Purpose: Patterned Wafer Inspection System, to monitor Patterned wafers particles and defects for yield manager. ‧Model: KLA-Tencor 2135 ‧Original Manufacture Date: October, 2000 ‧SN: W21XX812 System configuration: ‧Currently Configured for 200mm Wafer Size ‧Cassette Handling: Vacuum Handling Open Handler

2024年9月23日 · KLA-Tencor 2135 是一款功能强大且高效的掩模和晶圆检测设备，适用于半导体工业中各种复杂和精细的检测需求。 KLA-Tencor 2135 晶圆检测仪是一种高duan的掩模和晶圆检测系统，具有多种先进技术和高灵敏度成像功能。 以下...

Buy or sell a used KLA 2135 on Moov's marketplace. 1,000s of verified listings, new tools added daily.

KLA/TENCOR 2135是一个先进的掩模和晶圆检测系统，具有高分辨率的成像系统，自动光学变焦和对焦，自动调平和自动对比度，并且能够捕捉到亮场和暗场图像。

2025年2月4日 · At Bridge Tronic Global, our refurbishment services breathe new life into used semiconductor manufacturing equipment, ensuring peak performance at a fraction of the cost. Our expert technicians meticulously restore equipment from leading brands like KLA and Hitachi, applying rigorous testing and quality control measures.