The XPS Spectra section provides raw and processed survey spectra, chemical state spectra, BE values, FWHM values, and overlays of key spectra. Atom% values from surveys are based on sample, as received, and Scofield cross-sections. Atom% values are corrected for IMFP and PE. Peak-fits are guides for practical, real-world applications.

1996年8月1日 · This paper deals with the XPS analysis for a LaF3 thin film oxygen sensor and the improvement in its prop- erties by using CuPc electrode thin-film. it can be calculated from the equation that the oxygen reducing reaction in curve (a) represents the case n = 1 (single electron) and the other reaction in curve (b) the case n = 2 (two electrons ...

2008年1月15日 · X-ray diffraction (XRD), Lambda 900 spectrophotometer and X-ray photoelectron spectroscopy (XPS) were employed to study crystal structure, transmittance and chemical composition of the coatings, respectively. Laser-induce damage threshold (LIDT) was determined by a tripled Nd:YAG laser system with a pulse width of 8 ns. It is found that the ...

Lanthanum X-ray photoelectron spectra, lanthanum electron configuration, and other elemental information. La3d is the primary XPS region, but La4p and La4d regions can help assign the chemistry of lanthanum compounds. La3d region has well-separated spin-orbit components. Each spin-orbit component is further split by multiplet splitting.

2010年2月1日 · LaF 3 thin films were prepared by electron beam evaporation with different temperatures and deposition rates. Microstructure properties including crystalline structure and surface roughness were investigated by X-ray diffraction (XRD) and optical profilograph.

1990年6月1日 · The overlayers and the detailed interface reactions were probed with high resolution XPS in our home laboratory, and by soft XPS using the synchrotron source SRS at Daresbury laboratory, both systems used in conjunction with LEED.

(a) XPS survey spectra of LaF 3 nanoparticles and corresponding deconvoluted XPS spectra of (b) C 1s, (c) La 3d, (d) F 1s, and (e) O 1s. The present work focused on the extreme pressure...

xps 已被用于研究发生在氟离子选择性电极膜表面的离子交换过程。 结果表明，离子交换发生的深度远大于最外层固体表面单层的深度。 研究了氢氧根离子干扰对电极响应的影响，并提出了其作用机制。

xps 已用于检查氟离子选择性电极膜的表面。 已经发现水化学吸附在LaF3晶体的表面上。 在长时间暴露于水中后，在 LaF3 膜上发现了表面降解产物。

2024年12月5日 · X-ray photoelectron spectroscopy (XPS) was performed to determine the elemental presence in the LaF 3:1%Tb,1%Bi nanophosphor. A pellet with a thickness of 1 mm and a diameter of 6 mm was prepared for this measurement. A wide-scan spectrum covering a binding energy range of 0–1300 eV was acquired.