2005年8月1日 · Freshly cleaved mica and a mica surface treated with pure water and dilute-salt solution have been investigated by Atomic Force Microscopy (AFM). On the bare mica surface (after repeated scanning), small dots and islands were observed.

2016年6月1日 · AFM is ideally suited to imaging very flat crystalline surfaces like mica down to atomic resolution, and the mica lattice is often used as an imaging standard for nanoscale calibration of the piezoelectric scanners in an AFM. Indeed, mica has been important as a resolution standard to aid understanding of AFM operation as well as in the ...

This article describes sample preparation techniques for AFM imaging of DNA and protein–DNA complexes. The approach is based on chemical functionalization of the mica surface with aminopropyl silatrane (APS) to yield an APS-mica surface.

2003年5月1日 · AFM data indicated that both the topological structures and secondary structures of DNA molecules on mica are depended on the type of alkaline earth metal ions. The trapping effects on mica in the presence of the four metal ions demonstrated that DNA could equilibrate on mica in the solutions containing Mg 2+ based on the measured end-to-end ...

Surface preparation is a key step for reliable and reproducible imaging of DNA and protein-DNA complexes with atomic force microscopy (AFM). This article describes the approaches for chemical functionalization of the mica surface. One approach utilizes 3-aminopropyl-trietoxy silane (APTES), enabling one to obtain a smooth surface termed AP-mica.

Taking into account the Coulomb and exchange forces, atomic force microscopy (AFM) and lateral force microscopy (LFM) simulations were performed for a Si(OH) 4 tip and a cleaved mica surface under planer two-dimensional periodic boundary conditions.

The attractive feature of mica as a substrate for AFM studies is the smoothness of the surface. Mica, primarily muscovite mica, is the most widely used substrate for AFM imaging of various biological objects, nucleic acids in particular.

Mica, 15mmx15mm, thickness 0.15-0.2 mm, V-1 grade, Clear - Hard, of uniform color, nearly flat, free of all stains, foreign inclusion, cracks, and other similar defects. Perfect for AFM substrate

2010年3月3日 · Scanning probe instruments, such as the atomic force microscope (AFM) and its precursor, the scanning tunnelling microscope, provide atomic resolution but are restricted to imaging the...

Freshly cleaved ruby muscovite mica surfaces are extremely even and flat. They are also quite transparent and free from scratches and contamination. Cleaved mica is traditionally used in electron microscopy for the production of carbon support …