Zero-dimensional MoS2 quantum dots (QDs) possess distinct physical and chemical properties, which have garnered them considerable attention and facilitates their use in a broad range of...

We evaluated how these defects impact the electronic structure of MoS2 thin films by measurements taken from Raman, X-ray photoelectron spectroscopy (XPS), photoluminescence spectroscopy (PL),...

1998年9月1日 · Here, the chemical modification of single crystal natural 2H-MoS 2 using a radio-frequency (RF) oxygen plasma was characterised by XPS. The depth variation of the composition within the surface of the plasma-treated samples was also investigated.

2014年7月9日 · Molybdenum disulfide (MoS 2), a two-dimensional material purchased from SPI supplies, was analyzed using high-resolution X-ray photoelectron spectroscopy (XPS). A flake was mechanically exfoliated from a MoS 2 bulk single crystal for the study.

Layered transition metal dichalcogenides especially MoS2 is favorable to be the low-cost alternative to Pt-based electrocatalysts for water splitting. Defect-rich MoS2 nanosheets exhibiting...

使用高分辨率X射线光电子能谱（XPS）分析了从SPI供应商购买的二维材料二硫化钼（MoS2）。 从MoS2块状单晶中机械剥落薄片以进行研究。 使用单色AlKα辐射在0.83401 nm处获得的MoS2的XPS光谱包括测量扫描，O 1s，Mo 3p，C 1s，Mo 3d，S 2s，S 2p，Mo 4s，Mo 4p，S 3s的高分辨率光谱，和价带。 在Mo 3d / S 2s，S 2p和Mo 4s / Mo 4p / S 3s /价带区域附近收集了扩展的能量范围，从而可以拟合表面等离子体激元特征并确定Tougaard散射截面参数。 定量分析表 …

The high-resolution XPS spectra show that the binding energies of Mo 3d3/2 and Mo 3d5/2, peaks are located at 231.7 and 228.6 eV, 232 and 228.8 eV, for MoS2-NR/rGO nanohybrids and MoS2-NR, respectively, which can be attributed to Mo4+ in MoS2 crystals (Figure 5b).

2017年8月28日 · Here, we use in situ X-ray photoelectron spectroscopy (XPS) to investigate how the crystallography and structure of MoS 2 influence chemical transformations at solid-state interfaces with various other materials.

XPS Spectra Molybdenum (Mo) Compounds The XPS Spectra section provides raw and processed survey spectra, chemical state spectra, BE values, FWHM values, and overlays of key spectra. Atom% values from surveys are based on sample, as received, and Scofield cross-sections. Atom% values are corrected for IMFP and PE.

2017年1月15日 · Polycrystalline MoS2 grown by Mo sulphurization was exposed to increasing doses of Ar+ ions at 250 eV starting from 2.2 × 10 15 ions/cm 2 to 3.92 × 10 17 ions/cm 2. Electronic structure changes were monitored by X-Ray Photoelectron Spectroscopy (XPS) and Inverse Photolectron Spectroscopy (IPES).