na 是一种高活性金属，通常在 xps 谱中仅观察到钠化合物。 钠的存在，尤其在存在氯和强碳氢化合物 C1s 峰时，可能表明未戴手套进行手动操作造成了污染。

2006年7月1日 · In the present work, sodium species in the carbon cathodes were studied by X-ray photoelectron spectroscopy (XPS). XPS is a very attractive technique as it allows direct observation of various Na species as well as yielding a measure for …

Sodium cobalt oxide (NCO) has been synthesized by a glycine assisted sol-gel combustion method. XRD studies confirm the P2 phase formation of NCO. Na exists in two different environments in the NCO...

2011年1月1日 · The XPS and NMR results indicate that a third oxygen species O 2− (free oxygen) is present in sodic glasses over a wide range of composition and it increases in abundance with increased Na 2 O content.

In the F1s and Na 1s region ( Figure 3 (c, d)), the spectra are dominated by peaks that can mainly be assigned to NaF resulting from NaPF 6 decomposition. Additionally, some other sodium salts...

Na is a highly reactive metal and usually only sodium compounds will be observed in XPS spectra. The presence of sodium, especially with the presence of chlorine and an intense hydrocarbon C1s peak, can indicate contamination from manual handling, without the …

刚对碳量子点做了xps测试，第一次做，不知道na kll俄歇谱峰怎么处理呢。 写到paper里，Na KLL我该怎么解释呢。 我这样标示对不对呢，请教大家，

It is noticeable that the pristine electrode composition does not show any XPS signals due to Na and P elements (Figure 8). However, it has to be taken into account that the sodium signals of Na...

The Basic XPS Information Section provides fundamental XPS spectra, BE values, FWHM values, BE tables, overlays of key spectra, histograms and a table of XPS parameters. The Advanced XPS Information Section is a collection of additional spectra, overlays of spectra, peak-fit advice, data collection guidance, material info,

XPS, 全称为X-ray Photoelectron Spectroscopy（X射线光电子能谱）, 早期也被称为ESCA (Electron Spectroscopy for Chemical Analysis)，是一种使用电子谱仪测量X-射线光子辐照时样品表面所发射出的光电子和俄歇电子能量分布的方法。 XPS可用于定性分析以及半定量分析, 一般从XPS图谱的峰位和峰形获得样品表面元素成分、化学态和分子结构等信息，从峰强 可获得样品表面元素含量或浓度。 XPS测表面还是体相？ XPS是一种典型的表面分析手段。其根本原因在 …