The combination of a Cold FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV. "NEOARM" is also equipped with an automated aberration correction system that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction.

"NEOARM"は、当社独自の技術で開発された冷陰極電界放出形電子銃（Cold-FEG）と高次の収差まで補正可能な新型球面収差補正装置（ASCOR）を標準搭載し、200 kVの高加速電圧だけでなく30 kVの低加速電圧においても原子分解能での観察を実現しました。

The NEOARM excels at atomic-resolution imaging for a wide range of accelerating voltages ranging from 30 kV to 200 kV. The NEOARM features a unique cold field emission gun (Cold-FEG) as well as a next generation advanced Cs corrector (ASCOR) that compensates for higher order aberrations.

The NEOARM will be calibrated in STEM aberration corrected mode to operate at 200 kV, 80 kV and 40 kV, providing exceptional versatility for imaging a wide range of different materials including beam sensitive organic materials.

“NEOARM” 标配了日本电子独自开发的冷场发射电子枪（Cold-FEG）和全新的高阶球差校正器（ASCOR）。 无论是在200kV的高加速电压还是在30kV的低加速电压下，均能实现原子级分辨率的观察与分析。

日本JEOL原子级分辨率透射电子显微镜JEM-ARM200F NEOARM. NEOARM” 标配了日本电子独自开发的冷场发射电子枪（Cold-FEG）和全新的高阶球差校正器（ASCOR）。 无论是在200kV的高加速电压还是在30kV的低加速电压下，均能实现原子级分辨率的观察与分析。 同时还配备了自动像差校正系统，可以自动进行快速准确的像差校正。 新STEM成像技术（e-ABF法）可以更加简便地观察到含有轻元素样品的高清晰（衬度）图像。 产品规格： 主要特点： 球差校正 …

"NEOARM" / JEM-ARM200F comes with JEOL’s unique cold field emission gun (Cold FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV.

ASCOR (Advanced STEM Cs corrector) can suppress the six-fold astigmatism aberration resolution after Cs correction. The combination of Cold FEG and ASCOR gives low chromatic aberration and expands diffraction achieving higher resolution than ever. “NEO algorithm”. Now, no special sample is required for corrector tuning.

2017年6月日本电子株式会社推出了最新款的NEO ARM,采用自动球差校正软件、且低压下的分辨能力超强，适用范围进一步扩大，为材料科学研究提供了一个更全面分分析平台。 锂电池材料从生产到检测、分析的整体思路，具有重要参考意义。 包括三方面： 1）微区表面形貌观察及分析 2）化学分析 3）制造. 透射电镜JEM-ARM200F (C)-NEO ARM的使用方法? 日本电子JEM-ARM200F (C)-NEO ARM多少钱一台? 透射电镜JEM-ARM200F (C)-NEO ARM可以检测什么？ …

The NEOARM is a probe aberration corrected S/TEM with a Cold Field Emission Gun (cFEG), the first-of-its-kind in Virginia Tech, with the following features: •Aberration corrector alignment: High-precision correction of higher order aberrations up to …