The PXIe-4139 is a high-precision, system source measure unit (SMU) that features 4-quadrant operation and sources up to 40 W of DC power. This module features analog-to-digital converters that help you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s.

These specifications apply to the PXIe-4139. Warranted specifications describe the performance of a model under stated operating conditions and are covered by the model warranty. Characteristics describe values that are relevant to the use of the model under stated operating conditions but are not covered by the model warranty.

This document explains how to install, configure, and test the NI PXIe-4138/4139 (NI 4138/4139). The NI 4138/4139 is a single channel system source measurement unit (SMU). To access NI 4138/4139 documentation, navigate to Start»All Programs»National Instruments»NI-DCPower»Documentation.

PXIe-4139 (20W) shows as NI PXIe-4139. • Device front panel—The PXIe-4139 (40W) shows PXIe-4139 40W System SMU, and the PXIe-4139 (20W) shows NI PXIe-4139 Precision System SMU

PXIe-4139 PXIe, ±60 V, ±3 A (DC)/±10 A (Pulsed) Precision System PXI Source Measure Unit This document contains the verification and adjustment procedures for the PXIe-4139. Refer to ni.com/calibration for more information about calibration solutions. Note In this document, the PXIe-4139 (40W) and PXIe-4139 (20W) are referred to

例如，NI PXIe-4139 SMU 与 NI InstrumentStudio™ 2022 一起使用来测量 LED 的 IV 曲线。 目标受众是需要对二极管、太阳能电池、LED 和晶体管等设备进行故障分析和参数表征的用户。

pxie-4139是一款高精度系统源测量单元(smu)，具有四象限操作功能，可提供高达40 w的直流电。 该模块配有模数转换器，可帮助您以100 fA的电流分辨率执行高精度测量或以高达1.8 MS/s的速度进行采集。

These specifications apply to the PXIe-4139. Note In this document, the PXIe-4139 (40W) and PXIe-4139 (20W) are referred to inclusively as the PXIe-4139. The information in this document applies to all versions of the PXIe-4139 unless otherwise specified.

The new NI PXIe-4138/4139 System SMUs deliver high power, precision, and speed in a single slot PXI-express module. The combination of power, precision and speed makes these SMUs suitable for a broad range of applications in manufacturing test or lab characterization with devices ranging from ICs (including PMICs, RFICs) and discretes