
LiOx-modification of Ni and Co3O4 surfaces: An XPS
2021年11月1日 · LiO x was deposited at room temperature by physical vapor deposition (PVD) on polycrystalline Ni foil and Co 3 O 4 (111) thin film, creating uniform model systems well-suited for surface-sensitive characterization by X-ray photoelectron spectroscopy (XPS), low energy ion scattering (LEIS) or low energy electron diffraction (LEED).
XPS survey (a), C1s (b), O1s (c), and Ni2p (d) spectra
From the investigation, annealing at 350 °C results in the formation of NiO, and through X-ray Photoelectron Spectroscopy (XPS), it evidences the existence of Ni3 + which is confirmed along with...
Use of oxygen/nickel ratios in the XPS characterisation of oxide phases ...
2012年8月1日 · The O/Ni atomic ratios for a number of Ni oxides were calculated. The O/Ni ratios found to correspond well with the expected stoichiometry. Metal 2p peak shapes and O/Ni ratios used to estimate proportions of mixed oxides on metal surfaces. 1. Introduction.
镍金属和氧化物 XPS 光谱的新解释,Surface Science - X-MOL
摘要 目前对 Ni 金属 XPS 光谱的解释假设主要的 6 eV 卫星是由于两个孔 c3d 9 4s 2 (c 是一个核心孔)最终状态效应。 我们报告了 AES 在低电压损失(等离子体激元和带间跃迁)下的 REELS 观测,对应于 Ni 金属 2p 光谱中的卫星结构。
XPS spectra of NiO nanocrystals: (a) Ni2p XPS spectra. (b) O1s XPS …
X-ray diffraction (XRD), atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS), and UV-Vis spectroscopy techniques were used to analyze the structural, morphological, chemical ...
Regulating the Ni3+/Ni2+ ratio of NiOx by plasma treatment for …
2022年9月1日 · Herein, we developed a facile plasma post-treatment for the electron-beam evaporated NiO x to regulate its Ni 3+ /Ni 2+ ratio and improve its electronic performance. By using O 2 plasma treatment, we successfully enhanced the conductivity of the NiOx and optimized the charge-extraction capability.
氧化镍的XPS分峰以及其价态归属问题 - 第 2 页 - 催化 - 小木虫
小弟最近制备了一种氧化镍,是先生成Ni (OH)2的前驱体,然后在氩气的氛围下进行高温500℃处理,得到氧化镍。 但是在进行XPS测试的时候对于氧化镍的某些峰的归属出现了疑惑。 Ni2p 3/2轨道会和文献的形状不一样,出现了一个裂解峰(multiplet-split)。 但是我查阅文献很少遇到我这种情况。 在XPS的分析软件Advantage里面我看到了和我一样的图形。 里面说到那个multiplet-split的峰氧化镍也会出现。 但是目前文献上大多数把这个峰归于Ni (III)的峰。 就是在850-858eV之间 …
XPS depth profile analysis of non-stoichiometric NiO films
Using XPS depth profiling we investigated the NiO x overstoichiometry (x > 1) in the films that was found by other methods and the chemical changes in the films during annealing. A direct detection of Ni 3+ failed because of strong preferential sputtering with the formation of …
XPS spectra for a) Ni 2p spectra, b) Co 2p spectra of NCO@rGO …
Researchers are investigating innovative composite materials for renewable energy and energy storage systems. The major goals of this studies are i) to develop a low‐cost and stable trimetallic...
Characterization of NiO by XPS,Surface Science Spectra - X-MOL
We report x‐ray photoemission spectra (XPS) of nickelous oxide (NiO). XPS spectra were measured with the Physical Electronics Model 5400 x‐ray photoelectron spectrometer using unmonochromatized Mg Kα x rays at two pass energy settings corresponding to analyzer energy resolutions of 1.34 and 0.54 eV.
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