2012年4月23日 · X-ray linear dichroism (XLD) effects at the Ni ${L}_{2}$ edge of NiO films grown on Fe(001) were studied systematically as a function of NiO thickness (${d}_{\mathrm{NiO}}$), temperature, interfacial modulation, and Fe magnetization directions. We found that the Ni XLD signal exhibited an unusual dependence on ${d}_{\mathrm{NiO}}$.

2012年5月1日 · The domain structure of antiferromagnetic (AFM) NiO (100) has been investigated by nonmagnetic x-ray linear dichroism (XLD) at the O K edge using photoemission electron microscopy and linearly polarized x-ray light.

2017年3月20日 · The XLD signal of NiO/SrTiO 3 (110) structure could reflect the preferential orbital occupancy of the (110)-oriented NiO thin film, which could be induced by the nonrelaxed substrate strain...

2008年8月15日 · Antiferromagnetic (AFM) NiO thin films are grown epitaxially on vicinal Ag(118) substrate and investigated by x-ray linear dichroism (XLD). We find that the NiO AFM spins exhibit an in-plane spin-reorientation transition from parallel to perpendicular to the step edge direction with increasing the NiO film thickness.

2023年3月24日 · We report on the magnetic properties of antiferromagnetic NiO (001) thin films in epitaxially grown NiO/MgO (dMgO)/Cr/MgO (001) system for different thicknesses of MgO, dMgO. Results of X-ray...

2023年12月1日 · Surface antiferromagnetism of NiO film, epitaxially deposited on Ag(001), is investigated using the absorption of linearly polarised X-ray and the diffraction of low-energy unpolarised electrons. Polarisation-dependent X-ray absorption studies reveal a preferential stabilisation of the magnetic domains with the main components of magnetic axes ...

2018年8月15日 · Using X-ray Magnetic Linear Dichroism (XMLD) measurement, we investigate the antiferromagnetic (AFM) NiO spin reorientation transition (SRT) in epitaxial NiO/CoO/MgO (0 0 1) system at room temperature and constructed a complete NiO spin phase diagram.

Antiferromagnetic AFM NiO thin films are grown epitaxially on vicinalAg 118 substrate and investigated by x-ray linear dichroism XLD . We find that the NiO AFM spins exhibit an in-plane spin-reorientation transition from parallel to perpendicular to the step edge direction with increasing the NiO film thickness. In addition to the conventional L

Antiferromagnetic (AFM) domain structures of a NiO (100) surface have been observed using a combined method of photoelectron emission microscopy (PEEM) and soft-X-ray linear dichroism (LD) at an O K edge. Since oxygen atoms in NiO crystal should not have any magnetic moment, this imaging result was unexpected.

The domain structure of antiferromagnetic (AFM) NiO (100) has been investigated by nonmagnetic x-ray linear dichroism (XLD) at the O K edge using photoemission electron microscopy and linearly...