Main and Satellite Features in the Ni 2p XPS of NiO
Nov 2, 2022 · The origin and assignment of the complex main and satellite X-ray photoelectron spectroscopy (XPS) features of the cations in ionic compounds have been the subject of …
镍 | Thermo Fisher Scientific - CN
Ni2p 峰具有明显的自旋轨道分裂峰 (Δ 金属 =17.3 eV)。 镍金属谱图的峰形复杂。 主峰与卫星特征峰混杂。 Ni金属的卫星峰不要和氧化镍的峰混淆了。 镍化合物也可能具有复杂、多重劈裂的 …
XPS spectra of NiO nanocrystals: (a) Ni2p XPS spectra. (b) O1s XPS …
The prepared NiO nanoparticles are characterized by thermogravimetric analysis (TGA) that reveal the successful codoping and assure the thermal stability of the samples beyond 550˚C.
Comparison of Nanoscaled and Bulk NiO Structural and …
Nov 30, 2012 · NiO has been analyzed by X-ray diffraction (XRD), X-ray absorption fine structure (XAFS) analysis, and X-ray photoelectron spectroscopy (XPS) for bulk-scale and nanosized …
Use of oxygen/nickel ratios in the XPS characterisation of oxide phases ...
Aug 1, 2012 · The O/Ni ratios derived from the X-ray photoelectron (XP) spectra of a number of well-characterised Ni oxides were calculated and found to correspond well to the expected …
Surface effects in the Ni $2p$ x-ray photoemission spectra of NiO
Jun 28, 2007 · We report experimental and theoretical evidence of surface effects in the Ni x-ray photoemission spectra (XPS) of NiO. The Ni surface-enhanced XPS of a NiO sample show a …
XPS spectral analysis for a multiple oxide comprising NiO, TiO
Oct 1, 2020 · Principal component analysis (PCA) was conducted to analyze XPS spectra comprising NiO, TiO 2, and NiTiO 3. The PCA could provide the accurate ratio of NiTiO 3 and …
Detailed peak fitting analysis of the Ni 2 - ScienceDirect
Jan 1, 2023 · We analyzed the composition of the oxide and the mechanism of oxidation through angle-resolved X-ray photoelectron spectroscopy (ARXPS), which can provide information on …
Characterization of NiO by XPS
Jul 1, 1994 · We report x-ray photoemission spectra (XPS) of nickelous oxide (NiO). XPS spectra were measured with the Physical Electronics Model 5400 x-ray photoelectron spectrometer …
XPS survey (a), C1s (b), O1s (c), and Ni2p (d) spectra of NiO thin …
From the investigation, annealing at 350 °C results in the formation of NiO, and through X-ray Photoelectron Spectroscopy (XPS), it evidences the existence of Ni3 + which is confirmed …
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