Fig. 2 presents the XRD patterns of P3HT and P3HT/GO nanocomposite. For P3HT, the pattern is dominated by an intense thin peak at 2θ=6.65° corresponding to (100) diffraction indicating...

2021年4月1日 · A preliminary XRD analysis assessed the perfect reproducibility of perovskite structural properties, thus enabling an accurate investigation of the P3HT layers to be carried out, excluding disturbance of the underlying films.

摘要 采用 x 射线衍射 (xrd) 和电子自旋共振 (esr) 研究聚 3-己基噻吩 (p3ht) 薄膜以揭示薄膜结构和分子组织。 XRD 数据显示包含噻吩环的平面之间的平面间距为 16.0 A 的衍射图案。

2008年3月3日 · Poly-3-hexylthiophene (P3HT) thin films were investigated by X-ray diffraction (XRD) and electron spin resonance (ESR) to reveal the film structure and molecular organization. The XRD data showed a diffraction pattern with a plane separation between the planes containing thiophene rings of 16.0 Å.

2016年6月9日 · Specular X-ray diffraction (XRD) was used to compare the crystallinity of the acceptors in films that were slightly thicker than those used in device fabrication...

Figure 4 shows the room temperature XRD pattern of as-prepared pristine P3HT and P3HT: DH6T blended films. Spin-coated films of pristine P3HT exhibited a weak (100) diffraction peak at 2θ =...

Typical measured XRD spectra of P3HT and PCBM are shown in Figure 4. The highest and dominant XRD intensity peak of P3HT powder was located at about θ = 12o whilst that of PCBM was at θ = 1...

2024年12月2日 · The XRD diffractograms of thin films are presented in Fig. 1. The pristine P3HT possesses two diffraction peaks at positions ~ 5.8° and ~ 21° comparable to (100) and (010) orientations of the P3HT polymer with interlayer spacing formed by parallel stacks of main chains .

The electronic structure and film structure of poly(3-hexylthiophene) (P3HT) have been studied by X-ray diffraction (XRD) measurements, ultraviolet-visible (UV-vis) absorption spectroscopy, near-edge X-ray absorption fine structure (NEXAFS) measurements, ultraviolet photoemission spectroscopy (UPS) and inver

2023年8月1日 · The crystal structure of the perovskite layer was analyzed by a tabletop powder X-ray diffraction (XRD) instrument (PROTO make) using monochromatic Cu-Kα (λ = 0.154 nm) radiation. The surface properties of perovskite films were studied by dropping 5.0 μL hexane; the diameter of the hexane drop was 1.9 mm before landing on the surface.