2019年4月10日 · PFM enables non-destructive visualization and control of FE nanodomains, as well as direct measurements of the local physical characteristics of ferroelectrics, such as nucleation bias,...

双频共振跟踪 (dfrt) pfm. 在传统的pfm测量中，探针的振荡频率远低于悬臂梁的谐振频率(图7a)。在这些频率下工作的一个主要优点是，利用悬臂梁的挠度灵敏度，挠度可以很容易地转换为皮米。然而，信号通常很小，测量起来很有挑战性，特别是对于薄样本。

Piezoresponse force microscopy (PFM) is a functional Atomic force microscopy (AFM) mode, which probes electromechanical material properties on the nanometer scale in addition to the sample topography.

压电力显微镜（PFM）是一种功能性的原子力显微镜（AFM）模式，它除了能够探测样品的形貌外，还能在纳米尺度上探测材料的电机械性能。 当导电探针在接触模式下扫描样品表面时，施加的交流电压会在压电化合物中引发电机械响应，从而解析出压电和铁电性能的局部变化。 PFM因其能够提供关于各种材料（包括现代通信技术中的执行器、传感器和电容器）电机械耦合特性的详细信息而越来越受到认可。 压电力显微镜（PFM）是一种功能性的原子力显微镜（AFM）模式，它 …

One of AFM offsprings - Piezoresponse Force Microscopy (PFM) [1-4] is based on sensing of a tiny displacement of the samples caused by electric field excitation. A microfabricated probe with the tip dimensions in the nanometer scale is employed for this detection that can be performed with unique spatial resolution.

Explore Piezoelectric Force Microscopy (PFM) for studying nanoscale piezoelectric materials and ferroelectric domains. Visualize material responses with high resolution imaging techniques.

本文所描述的压电力显微法或压电响应力显微法（PFM）是扫描探针显微家族中用于研究纳米级材料压电现象的电学模式。 PFM在测量纳米级形貌的同时，还测量材料对电压施加的机械响应。 压电性就是在某些固体材料中积累的电荷，并对机械应力作出反应。 许多材料是压电材料，某些晶体，陶瓷和生物材料，例如牙齿，骨骼，DNA和各种蛋白质。 对于生物样品，其固有的压电性可能与其力学生物学有关。 压电效应是由外加机械力产生的内部电荷引起的。 逆压电效应是由外加 …

2017年1月31日 · In this study, we examine the impact of the electrostatic effect on the electromechanical (EM) response in piezoresponse force microscopy as a model AFM mode. We quantitatively studied the effects...

PFM成像主要包含两种模式： DART PFM （Dual AC Resonance-Tracking (DART)双频追踪PFM）和普通单频PFM，一般来讲，DART PFM的效果更好，受形貌影响更小。 两者都通过探针和样品的接触共振来增强PFM信号。

2018年1月11日 · Here, vector piezoresponse force microscopy (vector-PFM) has been applied in order to reconstruct the ferroelectric domain orientation distribution function of polished sections of device-ready...

2023年3月31日 · We start by tracking the emergence of the ferroelectric polarization during the PLD growth of epitaxial PZT films of 10–15 nm on (110)-oriented DyScO 3 (DSO) substrates with a 5 nm conducting SrRuO 3 (SRO) buffer layer using ISHG.

2017年9月18日 · Piezoresponse force microscopy (PFM) is a powerful technique to characterize ferroelectric thin films by measuring the dynamic electromechanical response. The ferroelectricity is commonly demonstrated by the PFM hysteresis loops and a 180 o phase difference of PFM images before and after poling.

2019年1月1日 · PFM is detecting the electromechanical material response when locally biased with a conductive scanning probe microscopy (SPM) tip. The response is based on the inverse piezoelectric effect, which connects the electric field with a change in sample deformation through the piezoelectric coefficient d.

2022年10月15日 · With its excellent ferroelectric properties such as large dielectric constant and large remanent polarization, PZT thin films are extensively used in micro-sensors and other devices. In this study, the sol–gel process was used to fabricate Pb(Zr0.52Ti0.48)O3 thin films with Pb(ZrxTi1–x)O3 seed islands.

For the first time the study of self-polarization in doped mono-crystalline PZT thin films using PFM is presented. The direction of self-polarization in pure PZT on SRO is upwards whereas that of Fe dopes PZT is downwards.

2018年11月10日 · 牛津仪器发布了以原子力显微镜高灵敏PFM技术测试压电/铁电材料铁电畴以及电滞回线的解决方案，将助力于中国压电/铁电材料科学研究。 此份解决方案包括PFM工作原理、DART-PFM测试PZT薄膜的形貌以及电滞回线案例、PFM对BTO薄膜形貌的测试案例。 DART-PFM测试PZT薄膜的形貌以及电滞回线. 图1 溶胶-凝胶制备的PZT薄膜的（a）电滞回线和（b）同一区域的DART-PFM成像. 使用压电力显微镜对溶胶-凝胶制备的铁电陶瓷材料锆钛酸（PZT） …

We show examples of the implementation of nano-PUND and the advantages compared to PFM. Lead Zirconium Tantalate (PZT) is first used as a test material, then Hafnium Zirconium oxide (Hf 0.5 Zr 0.5 O 2), extensively studied but particularly delicate when probed by PFM, illustrates the capabilities of the method. [01:27:10] PRESENTATION 4

2021年5月28日 · 首先为了查看在不同极化方向上的一般pfm响应（即振幅差和相位差），实验利用了弹簧常数约为 3n/m的探针，在均匀向上极化的(001)定向外延pzt薄膜上获取了pfm振幅和相位图像。

Piezoresponse Force Microscopy (PFM) is a functional Atomic force microscopy (AFM) mode, which probes electromechanical material properties on the nanometer scale in addition to the sample topography.

2019年4月23日 · Polarization switching at nanoscale has been carried out for the first time using piezo force microscopy (PFM) to gain more insight into the interface between the PZT and MoS 2, which plays an important role in realizing viable devices. The results clearly show the importance of the interface between ferroelectric and 2D systems and the ...