The XRD pattern of PbSe nanoparticles for two equimolar concentration are shown in Figure 1, and indicate some intense peaks at 2 h 1⁄4 25.21 , 29.16 , 41.70 , and 51.71 , which corresponds to...

2022年8月31日 · Herein, we successfully synthesized 2D PbSe semiconductors with a large lateral dimension and ultrathin thickness via van der Waals epitaxy. The fabricated 2D PbSe device exhibits good electrical conductivity and superior multi-wavelength photoresponse performance with high responsivity (∼103 A/W) and impressive detectivity (∼2 × 10 11 Jones).

2021年8月1日 · PbSe nanocrystalline films were prepared using the magnetron sputtering technique with various sputtering powers and deposition times. The XRD patterns and Raman spectra indicate that increasing sputtering power and deposition time improves the crystallization quality of PbSe films.

2019年12月26日 · High-quality PbSe thin film and graphene were prepared by molecular beam epitaxy and chemical vapor deposition, respectively. The physical characteristics of PbSe thin film and graphene were performed using X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS) and Raman measurement.

The colloidal QD morphology, crystalline structure and size were examined by the methods of high-resolution transmission electron microscopy (HRTEM), scanning tunneling microscopy (STM), and powder X-ray diffraction (XRD). Elemental analysis was performed by means of X-ray photoelectron spectroscopy (XPS).

2024年8月14日 · These results indicate that high-quality InSe thin films could be adopted to construct PbSe/InSe heterojunction detector with high replicability and stability, making them a potential value in uncooled middle-wavelength infrared detection.

2022年1月13日 · X-ray diffraction (XRD) was performed for thin films prepared under two different iodization conditions. First, the iodization of an as-deposited thin film was carried out to confirm the rapid transformation of pure PbSe to PbI 2. XRD confirms the film has very little crystallinity, and only PbI 2 peaks were observed.

2020年10月9日 · The crystal structure and phase composition of the as-deposited and heat-treated PbSe films were studied by X-ray diffraction (XRD) measurements, using a DRON-4 diffractometer. The XRD patterns were recorded with the use of copper radiation and pyrolytic graphite as a monochromator to separate out the Cu K α1,2 doublet from the continuous ...

Up-to-date, chemical bath deposition method has been successfully used to deposit various thin lms including NiSe [8], PbS [9], CdTe [10], AgIn5S8 [11] and Cu4SnS4 [12]. The present work reports the preparation and physical characterization of PbSe thin lms onto micro-scope glass substrates using chemical bath deposition method.

Structural analysis realized by X-Ray Diffraction (XRD) technique showed the polycrystalline nature of the films, particularly observing a preferred <100> texture. Atomic Force Microscopy (AFM)...