2014年3月4日 · We were able to obtain structural information of CdSe/ZnS core–shell QDs using nano-beam diffraction by controlling the nano-probe of the dark field scanning TEM (DF-STEM) mode and strain analysis with high-resolution TEM (HRTEM)/STEM images.

2014年11月25日 · Contrary to popularly prepared cadmium selenide (CdSe) quantum dots (QDs) at temperatures above 200 °C, we here report synthesis of CdSe QDs at room temperature and above using wet-chemical method. Also we have used a much safer binder than the commonly used TOPO/TBPO.

通过控制暗场扫描TEM（DF-STEM）模式的纳米探针和高分辨率TEM（HRTEM）/应变分析，我们能够使用纳米束衍射获得CdSe / ZnS核壳量子点的结构信息。 STEM图片。 此外， CdSe / ZnS核-壳结构的纳米晶体量子点（QDs）由于其高量子效率，窄带和粒径可调的光致发光而成为发光应用的理想选择。 特别地，它们的小尺寸导致半导体纳米晶体的量子限制，这扩大了它们的能隙。 通常，由于量子点的尺寸非常小，因此使用透射电子显微镜（TEM）对量子点进行结构分 …

2022年1月6日 · In this study, we fabricated alloy-typed core/shell CdSeZnS/ZnS quantum dots (alloy QDs) that showed higher quantum yield and stability during the surface modification for hydrophilization compared with conventional CdSe/CdS/ZnS multilayer quantum dots (MQDs).

2024年6月17日 · Colloidal quantum dots (QDs) are attracting research interest because of their unique optical properties that result from the quantum confinement effect. ZnSe QDs,...

2016年6月14日 · Semiconductor quantum dots (QDs) exhibit peculiar physical and chemical characteristics when their size is comparable to Bohr exciton radius, and the quantum confinement effect leads to tunable optical properties.

2021年8月7日 · The TEM images of the QDs were obtained using a JEOL JEM-2100 F at 200 KV, and the average size and size distribution were analyzed using the software of nanomeasure. The results of TEM indicate that the grain size distribution …

2004年11月17日 · The potential of combined use of conventional transmission electron microscopy (CTEM), high-resolution TEM imaging (HRTEM) and digital analysis is applied to study (Si,Ge) islands grown by liquid phase epitaxy (LPE) on Si substrates and Ga(Sb,As) quantum dot (QDs) structures grown by metal-organic …

CdSe quantum dots (QDs) grown on ZnSe were investigated by various transmission electron microscopy (TEM) techniques including diffraction contrast imaging, high‐resolution and analytical transmission electron microscopy both of plan‐view as well as cross‐section specimens.

使用 Cs 校正 HR-STEM/TEM 对核/壳 CdSe/ZnS 量子点 (QD) 和石墨烯 QD 进行高分辨率成像分析 Microscopy and Microanalysis ( IF 2.9) Pub Date : 2016-10-19, DOI: 10.1017/s1431927613009719