s-SNOM (scattering-type Scanning Near-field Optical Microscopy) delivers material-characteristic maps of chemical and optical properties of the sample surface at the spatial resolution of an atomic force microscope (AFM).

2016年10月17日 · Scattering-type scanning near-field optical microscopy (s-SNOM) allows spectroscopic imaging with spatial resolution below the diffraction limit. With suitable light sources, s-SNOM...

2018年5月21日 · Scattering-type scanning near-field optical microscopy (s-SNOM) enables nanoscale spectroscopic imaging and has been instrumental for many nano-photonic discoveries and in situ...

Basic principle of s-SNOM: (1) focus light onto a sharp AFM tip; (2) illuminated tip creates strong near-field nano-focus at tip apex; (3) nano-focus probes optical properties of the sample modifying the

2025年2月10日 · Scattering-type scanning near-field optical microscopy (s-SNOM) enables nanoscale imaging and spectroscopy through elastic light scattering at a scanning probe tip.

The s-SNOM technique works on a variety of materials, but the best signal to noise tends to be on harder materials with high reflectivity, high dielectric constants, and/or strong optical resonances. Bruker's nanoIR3-s provides an ideal platform for s-SNOM capabilities, eliminating the need for complex optical alignments:

2020年4月6日 · Our smart s-SNOM approach is generally applicable and provides systematic full spatio-spectral s-SNOM imaging with a large field of view at high spectral resolution and reduced acquisition time. KEYWORDS: s-SNOM, compressed sensing, matrix completion, adaptive sampling, denoising, near field I

互补的afm-ir和散射snom图像首次揭示了光学奇性在表面结构上的微尺度起源。通过访问关于质的结构的辐射 （s-snom） 和非辐射 （afm-ir） 信息，可以获得独特且互补的质质属性。

2022年9月8日 · Scattering-type scanning near-field optical microscopy (s-SNOM) allows ultrabroadband optical (0.5–3000 µm) nanoimaging and nanospectroscopy with fine spatial (<10 nm), spectral (<1 cm−1), and tempor...

Transmission s-SNOM (scattering-type Scanning Near-field Optical Microscopy) provides polarization-resolved field mapping across visible and IR spectral ranges with nanoscale spatial resolution.