Exploiting XPS for the identification of sulfides and polysulfides
The identification of surface sulfide and polysulfide species based on the curve fitting of S2p photoelectron spectra and, for the first time, of X-ray excited S KLL Auger spectra has been …
利用XPS鉴定硫化物和多硫化物 † ,RSC Advances - X-MOL
基于S2p光电子光谱以及首次通过X射线激发的S KLL Auger光谱的曲线拟合，鉴定了表面硫化物和多硫化物种类。 表面上存在的不同硫化学状态（多硫化物链中的硫化物S 2−，中心S和末 …
Exploiting XPS for the identification of sulfides and polysulfides
2015年8月28日 · The identification of surface sulfide and polysulfide species based on the curve fitting of S2p photoelectron spectra and, for the first time, of X-ray excited S KLL Auger spectra …
Auger parameters for sulfur-containing compounds using a …
1990年1月1日 · It is seen from Table 2 that the maximum chemical shifts for S2p, S KLL and the AP are 8.3,10.3 and 4.1 eV, respectively. As expected, the ability to uniquely identify the …
The development of laboratory-based high energy sources for XPS
2024年3月13日 · The silver source with its binding energy scale extending up to close to 3,000 eV allows access to many deeper core levels; 1 s from Al through to S1s (and attendant KLL …
XPS数据分峰拟合中出现大峰包含小峰情况，是不合理的，实际情 …
在XPS测试谱图中，对于带2p、3d、4f标识的元素，比如S2p、Ba3d、Pb4f，由于存在 自旋劈裂效应 ，当这些元素存在一种化学态时，就会劈裂成两个不同属性的峰，对应XPS谱图通常会 …
X射线光电子能谱(XPS)谱图分析 - 知乎 - 知乎专栏
在xps中，可以观察到kll、lmm、mnn和noo四个系列的auger线。 KLL：左边代表起始空穴的电子层，中间代表填补起始空穴的电子所属的电子层，右边代表发射俄歇电子的电子层。
XPS实验结果数据说明_辰麦检测
2023年7月3日 · 实例说明六：上图中o kll, c kll即为o和c的俄歇电子谱线，从图中可以看到o kll其实有三组峰，最左边的为起始空穴的电子层，中间的是填补起始空穴的电子所属的电子层，右边 …
Exploiting XPS for the identification of sulfides and polysulfides
The identification of surface sulfide and polysulfide species based on the curve fitting of S2p photoelectron spectra and, for the first time, of X-ray excited S KLL Auger spectra has been …
Fig. 2 XPS high-resolution S2p spectra of (A) Li 2 S, (B) Na 2 S, (C)...
The identification of surface sulfide and polysulfide species based on the curve fitting of S2p photoelectron spectra and, for the first time, of X-ray excited S KLL Auger spectra has been...